JEDEC JESD 6
Measurement of Small Values of Transistor Capacitance
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| Organization: | JEDEC |
| Publication Date: | 1 February 1967 |
| Status: | active |
| Page Count: | 17 |
scope:
This standard gives a test method for measuring transistor capacitance using a three-terminal bridge which employs a guard-circuit that eliminates the effect of extraneous capacitance.
Document History
JEDEC JESD 6
February 1, 1967
Measurement of Small Values of Transistor Capacitance
This standard gives a test method for measuring transistor capacitance using a three-terminal bridge which employs a guard-circuit that eliminates the effect of extraneous capacitance.
January 1, 1967
Measurement of Small Values of Transistor Capacitance
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