JEDEC - JESD6
Measurement of Small Values of Transistor Capacitance
inactive
| Organization: | JEDEC |
| Publication Date: | 1 January 1967 |
| Status: | inactive |
| Page Count: | 15 |
Document History
February 1, 1967
Measurement of Small Values of Transistor Capacitance
This standard gives a test method for measuring transistor capacitance using a three-terminal bridge which employs a guard-circuit that eliminates the effect of extraneous capacitance.
JESD6
January 1, 1967
Measurement of Small Values of Transistor Capacitance
A description is not available for this item.