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JEDEC JESD 51-9

Test Boards for Area Array Surface Mount Package Thermal Measurements

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Organization: JEDEC
Publication Date: 1 July 2000
Status: active
Page Count: 22
scope:

This standard covers the design of printed circuit boards (PCBs) used in the thermal characterization of ball grid array (BGA) and land grid array (LGA) packages. It is intended to be used in conjunction with the JESD51 series of standards that cover the test methods and test environments. JESD51-9 was developed to give a figure-of-merit of thermal performance that allows for accurate comparisons of packages from different suppliers. It can be used to give a first order approximation of system performance and, in conjunction with the other JESD51 PCB standards, allows for comparisons of the various package families.

Document History

JEDEC JESD 51-9
July 1, 2000
Test Boards for Area Array Surface Mount Package Thermal Measurements
This standard covers the design of printed circuit boards (PCBs) used in the thermal characterization of ball grid array (BGA) and land grid array (LGA) packages. It is intended to be used in...

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