ASTM F980
STANDARD GUIDE FOR THE MEASUREMENT OF RAPID ANNEALING OF NEUTRON- INDUCED DISPLACEMENT DAMAGE IN SEMICONDUCTOR DEVICES (E1-1987)
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| Organization: | ASTM |
| Publication Date: | 27 March 1986 |
| Status: | inactive |
| Page Count: | 7 |
| ICS Code (Semiconductor devices in general): | 31.080.01 |
Document History
December 1, 2016
Standard Guide for Measurement of Rapid Annealing of Neutron-Induced Displacement Damage in Silicon Semiconductor Devices
This guide defines the requirements and procedures for testing silicon discrete semiconductor devices and integrated circuits for rapid-annealing effects from displacement damage resulting from...
December 1, 2016
Standard Guide for Measurement of Rapid Annealing of Neutron-Induced Displacement Damage in Silicon Semiconductor Devices
This guide defines the requirements and procedures for testing silicon discrete semiconductor devices and integrated circuits for rapid annealing effects from displacement damage resulting from...
December 1, 2010
Standard Guide for Measurement of Rapid Annealing of Neutron-Induced Displacement Damage in Silicon Semiconductor Devices
This guide defines the requirements and procedures for testing silicon discrete semiconductor devices and integrated circuits for rapid-annealing effects from displacement damage resulting from...
December 1, 2010
Standard Guide for Measurement of Rapid Annealing of Neutron-Induced Displacement Damage in Silicon Semiconductor Devices
This guide defines the requirements and procedures for testing silicon discrete semiconductor devices and integrated circuits for rapid-annealing effects from displacement damage resulting from...
January 15, 1992
STANDARD GUIDE FOR THE MEASUREMENT OF RAPID ANNEALING OF NEUTRON- INDUCED DISPLACEMENT DAMAGE IN SEMICONDUCTOR DEVICES (E1-1987)
A description is not available for this item.
ASTM F980
March 27, 1986
STANDARD GUIDE FOR THE MEASUREMENT OF RAPID ANNEALING OF NEUTRON- INDUCED DISPLACEMENT DAMAGE IN SEMICONDUCTOR DEVICES (E1-1987)
A description is not available for this item.