JEDEC JESD 51-1
Integrated Circuit Thermal Measurement Method - Electrical Test Method (Single Semiconductor Device)
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Organization: | JEDEC |
Publication Date: | 1 December 1995 |
Status: | active |
Page Count: | 36 |
scope:
The purpose of this test method is to define a standard Electrical Test Method (ETM) that can be used to determine the thermal characteristics of single integrated circuit devices housed in some form of electrical package. This method will provide a basis for comparison of different devices housed in the same electronic package or similar devices housed in different electronic packages.
Document History

JEDEC JESD 51-1
December 1, 1995
Integrated Circuit Thermal Measurement Method - Electrical Test Method (Single Semiconductor Device)
The purpose of this test method is to define a standard Electrical Test Method (ETM) that can be used to determine the thermal characteristics of single integrated circuit devices housed in some form...