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JEDEC JESD 51-1

Integrated Circuit Thermal Measurement Method - Electrical Test Method (Single Semiconductor Device)

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Organization: JEDEC
Publication Date: 1 December 1995
Status: active
Page Count: 36
scope:

The purpose of this test method is to define a standard Electrical Test Method (ETM) that can be used to determine the thermal characteristics of single integrated circuit devices housed in some form of electrical package. This method will provide a basis for comparison of different devices housed in the same electronic package or similar devices housed in different electronic packages.

Document History

JEDEC JESD 51-1
December 1, 1995
Integrated Circuit Thermal Measurement Method - Electrical Test Method (Single Semiconductor Device)
The purpose of this test method is to define a standard Electrical Test Method (ETM) that can be used to determine the thermal characteristics of single integrated circuit devices housed in some form...

References

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