JEDEC JESD 51-1
Integrated Circuit Thermal Measurement Method - Electrical Test Method (Single Semiconductor Device)
|Publication Date:||1 December 1995|
The purpose of this test method is to define a standard Electrical Test Method (ETM) that can be used to determine the thermal characteristics of single integrated circuit devices housed in some form of electrical package. This method will provide a basis for comparison of different devices housed in the same electronic package or similar devices housed in different electronic packages.