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DLA - SMD-5962-96698

MICROCIRCUIT, DIGITAL, ADVANCED BIPOLAR CMOS, SCAN TEST DEVICE WITH 18-BIT TRANSCEIVER/REGISTER, THREE-STATE OUTPUTS, TTL COMPATIBLE INPUTS, MONOLITHIC SILICON

inactive
Organization: DLA
Publication Date: 1 February 1996
Status: inactive
Page Count: 29
scope:

This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class V). A choice of case outlines and lead finishes are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of Radiation Hardness Assurance (RHA) levels are reflected in the PIN.

The PIN is as shown in the following example:

Device classes Q and V RHA marked devices meet the MIL-PRF-38535 specified RHA levels and are marked with the appropriate RHA designator. Device class M RHA marked devices meet the MIL-PRF-38535, appendix A specified RHA levels and are marked with the appropriate RHA designator. A dash (-) indicates a non-RHA device.

The device type(s) identify the circuit function as follows:

Device type Generic number Circuit function 01 54ABTH18646A Scan test device with 18-bit transceiver and register, three-state outputs, TTL compatible inputs

The device class designator is a single letter identifying the product assurance level as follows:

Device class Device requirements documentation M Vendor self-certification to the requirements for MIL-STD-883 compliant, non-JAN class level B microcircuits in accordance with MIL-PRF-38535, appendix A Q or V Certification and qualification to MIL-PRF-38535

The case outline(s) are as designated in MIL-STD-1835 and as follows:

Outline letter Descriptive designator Terminals Package style X See figure 1 68 Quad flat Package

The lead finish is as specified in MIL-PRF-38535 for device classes Q and V or MIL-PRF-38535, appendix A for device class M.

Supply voltage range (VCC) . . . . . . . . . . . . . . . . . . . . . . . −0.5 V dc to +7.0 V dc DC input voltage range (except I/O ports) (VIN) . . . . . . . . . . . . −0.5 V dc to +7.0 V dc 4/ DC input voltage range (I/O ports) (VIN) . . . . . . . . . . . . . . . −0.5 V dc to +5.5 V dc 4/ DC output voltage range (VOUT) . . . . . . . . . . . . . . . . . . . . . −0.5 V dc to +5.5 V dc 4/ DC output current (IOL) (per output) (A port or TDO) . . . . . . . . . . +96 mA DC output current (IOL) (per output) (B port) . . . . . . . . . . . . . +30 mA DC input clamp current (IIK) (VIN < 0.0 V) . . . . . . . . . . . . . . . −18 mA DC output clamp current (IOK) (VOUT < 0.0 V) . . . . . . . . . . . . . . −50 mA Storage temperature range (TSTG) . . . . . . . . . . . . . . . . . . . . −65°C to +150°C Lead temperature (soldering, 10 seconds) . . . . . . . . . . . . . . . . +300°C Thermal resistance, junction-to-case (ΘJC) . . . . . . . . . . . . . . . 1.9°C/W Junction temperature (TJ) . . . . . . . . . . . . . . . . . . . . . . . +175°C Maximum power dissipation (PD) (at TA = 55°C in still air) . . . . . . . 607 mW 5/

Supply voltage range (VCC) . . . . . . . . . . . . . . . . . . . . . . . +4.5 V dc to +5.5 V dc Input voltage range (VIN) . . . . . . . . . . . . . . . . . . . . . . . +0.0 V dc to VCC Maximum low level input voltage (VIL) . . . . . . . . . . . . . . . . . +0.8 V Minimum high level input voltage (VIH) . . . . . . . . . . . . . . . . . +2.0 V Maximum high level output current (IOH) . . . . . . . . . . . . . . . . −24 mA Maximum low level output current (IOL) . . . . . . . . . . . . . . . . . +48 mA Maximum input rise or fall rate (Δt/ΔV) . . . . . . . . . . . . . . . . 10 ns/V Case operating temperature range (TC) . . . . . . . . . . . . . . . . . −55°C to +125°C

Fault coverage measurement of manufacturing logic tests (MIL-STD-883, test method 5012) . . . . . . . XX percent 6/

intended Use:

Microcircuits conforming to this drawing are intended for use for Government microcircuit applications (original equipment), design applications, and logistics purposes.

Microcircuits... View More

Document History

June 25, 2015
MICROCIRCUIT, DIGITAL, ADVANCED BIPOLAR CMOS, SCAN TEST DEVICE WITH 18-BIT TRANSCEIVER/ REGISTER, THREE-STATE OUTPUTS, TTL COMPATIBLE INPUTS, MONOLITHIC SILICON
This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class V). A choice of case outlines and lead finishes...
December 17, 2008
MICROCIRCUIT, DIGITAL, ADVANCED BIPOLAR CMOS, SCAN TEST DEVICE WITH 18-BIT TRANSCEIVER/ REGISTER, THREE-STATE OUTPUTS, TTL COMPATIBLE INPUTS, MONOLITHIC SILICON
This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class V). A choice of case outlines and lead finishes...
SMD-5962-96698
February 1, 1996
MICROCIRCUIT, DIGITAL, ADVANCED BIPOLAR CMOS, SCAN TEST DEVICE WITH 18-BIT TRANSCEIVER/REGISTER, THREE-STATE OUTPUTS, TTL COMPATIBLE INPUTS, MONOLITHIC SILICON
This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class V). A choice of case outlines and lead finishes...

References

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