scope:

This drawing forms a part of a one part - one part number documentation system (see 6.6 herein). Two product assurance classes consisting of military high reliability (device classes Q and M) and space application (device class V), and a choice of case outlines and lead finishes are available and are reflected in the Part or Identifying Number (PIN). Device class M microcircuits represent non-JAN class B microcircuits in accordance with 1.2.1 of MIL-STD-883, "Provisions for the use of MIL-STD-883 in conjunction with compliant non-JAN devices". When available, a choice of Radiation Hardness Assurance (RHA) levels are reflected in the PIN.

The PIN shall be as shown in the following example:

Device class M RHA marked devices shall meet the MIL-I-38535 appendix A specified RHA levels and shall be marked with the appropriate RHA designator. Device classes Q and V RHA marked devices shall meet the MIL-I-38535 specified RHA levels and shall be marked with the appropriate RHA designator. A dash (-) indicates a non-RHA device.

The device type(s) shall identify the circuit function as follows:

Device type Generic number 1 Circuit function Access time Endurance 01 28F008 1M × 8 CMOS EEPROM 120 ns 10,000 cycles 02 28F008 1M × 8 CMOS EEPROM 100 ns 10,000 cycles

The device class designator shall be a single letter identifying the product assurance level as follows:

Device class Device requirements documentation M Vendor self-certification to the requirements for non-JAN class B microcircuits in accordance with 1.2.1 of MIL-STD-883 Q or V Certification and qualification to MIL-I-38535

The case outline(s) shall be as designated in MIL-STD-1835 and as follows:

Outline letter Descriptive designator Terminals Package style Q GDIP1-T40 or CDIP2-T40 40 Dual-in-line

The lead finish shall be as specified in MIL-STD-883 (see 3.1 herein) for class M or MIL-I-38535 for classes Q and V. Finish letter "X" shall not be marked on the microcircuit or its packaging. The "X" designation is for use in specifications when lead finishes A, B, and C are considered acceptable and interchangeable without preference.

Supply voltage range (V_CC) 3/ . . . . . . . . . . . . . . . . . . . −2.0 V dc to +7.0 V dc Storage temperature range (T_stg) . . . . . . . . . . . . . . . . . . −65°C to +150°C Maximum power dissipation (P_D) . . . . . . . . . . . . . . . . . . . 1.0 W Lead temperature (soldering, 10 seconds) . . . . . . . . . . . . . . +300°C Junction temperature (T_J) 4/ . . . . . . . . . . . . . . . . . . . +150°C Thermal resistance, junction-to-case (Θ_JC) (case outline Q) . . . . See MIL-STD-1835 Voltage on any pin with respect to ground 3/ . . . . . . . . . . . . −2.0 V dc to +7.0 V dc Voltage on pin A₉ with respect to ground 5/ . . . . . . . . . . . . −2.0 V dc to +13.5 V dc V_PP supply voltage with respect to ground 5/ . . . . . . . . . . . . −2.0 V dc to +14.0 V dc Output short circuit current 6/ . . . . . . . . . . . . . . . . . . 100 mA Data retention . . . . . . . . . . . . . . . . . . . . . . . . . . . 10 years, minimum Endurance (All device types) . . . . . . . . . . . . . . . . . . . . 10,000 cycles/byte, minimum

Supply voltage range (V_CC) . . . . . . . . . . . . . . . . . . . . +4.5 V dc to +5.5 V dc Operating temperature range (T_case) . . . . . . . . . . . . . . . −55°C to +125°C Low level input voltage range (V_IL) . . . . . . . . . . . . . . . −0.5 V dc to +0.8 V dc High level input voltage range (V_IH) . . . . . . . . . . . . . . . +2.0 V dc to V_CC +0.5 V dc High level input voltage range, CMOS (V_IH) . . . . . . . . . . . . +2.0 V dc to V_CC +0.5 V dc Chip clear (V_P) . . . . . . . . . . . . . . . . . . . . . . . . . 11.4 V dc to 12.6 V dc

Fault coverage measurement of manufacturing logic tests (MIL-STD-883, test method 5012) . . . . . . . . . . 99 percent

intended Use: