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JEDEC JESD 28-1

N-Channel MOSFET Hot Carrier Data Analysis

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Organization: JEDEC
Publication Date: 1 September 2001
Status: active
Page Count: 15
scope:

This addendum provides data analysis examples useful in analyzing MOSFET n-channel hot-carrier-induced degradation data. This addendum to JESD28 (Hot carrier n-channel testing standard) suggests hot-carrier data analysis techniques.

Document History

JEDEC JESD 28-1
September 1, 2001
N-Channel MOSFET Hot Carrier Data Analysis
This addendum provides data analysis examples useful in analyzing MOSFET n-channel hot-carrier-induced degradation data. This addendum to JESD28 (Hot carrier n-channel testing standard) suggests...

References

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