JEDEC JESD 28-1
N-Channel MOSFET Hot Carrier Data Analysis
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| Organization: | JEDEC |
| Publication Date: | 1 September 2001 |
| Status: | active |
| Page Count: | 15 |
scope:
This addendum provides data analysis examples useful in analyzing MOSFET n-channel hot-carrier-induced degradation data. This addendum to JESD28 (Hot carrier n-channel testing standard) suggests hot-carrier data analysis techniques.
Document History
JEDEC JESD 28-1
September 1, 2001
N-Channel MOSFET Hot Carrier Data Analysis
This addendum provides data analysis examples useful in analyzing MOSFET n-channel hot-carrier-induced degradation data. This addendum to JESD28 (Hot carrier n-channel testing standard) suggests...
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