JEDEC JESD 28-1
N-Channel MOSFET Hot Carrier Data Analysis
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Organization: | JEDEC |
Publication Date: | 1 September 2001 |
Status: | active |
Page Count: | 15 |
scope:
This addendum provides data analysis examples useful in analyzing MOSFET n-channel hot-carrier-induced degradation data. This addendum to JESD28 (Hot carrier n-channel testing standard) suggests hot-carrier data analysis techniques.
Document History

JEDEC JESD 28-1
September 1, 2001
N-Channel MOSFET Hot Carrier Data Analysis
This addendum provides data analysis examples useful in analyzing MOSFET n-channel hot-carrier-induced degradation data. This addendum to JESD28 (Hot carrier n-channel testing standard) suggests...