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DLA - SMD-5962-96743

MICROCIRCUIT, MEMORY, DIGITAL, CMOS, 1 MEG X 16 DRAM, MONOLITHIC SILICON

inactive
Organization: DLA
Publication Date: 28 February 1996
Status: inactive
Page Count: 31
scope:

This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class V). A choice of case outlines and lead finishes are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of Radiation Hardness Assurance (RHA) levels are reflected in the PIN.

The PIN is as shown in the following example:

Device classes Q and V RHA marked devices meet the MIL-PRF-38535 specified RHA levels and are marked with the appropriate RHA designator. Device class M RHA marked devices meet the MIL-PRF-38535, appendix A specified RHA levels and are marked with the appropriate RHA designator. A dash (-) indicates a non-RHA device.

The device type(s) identify the circuit function as follows:

Device type Generic number Circuit function Access time 01 416160-80 1 MEG-word by 16-bit DRAM, 32 ms refresh 80 ns 02 416160-70 1 MEG-word by 16-bit DRAM, 32 ms refresh 70 ns 03 418160-80 1 MEG-word by 16-bit DRAM, 8 ms refresh 80 ns 04 418160-70 1 MEG-word by 16-bit DRAM, 8 ms refresh 70 ns

The device class designator is a single letter identifying the product assurance level as follows:

Device class Device requirements documentation M Vendor self-certification to the requirements for MIL-STD-883 compliant, non-JAN class level B microcircuits in accordance with MIL-PRF-38535, appendix A Q or V Certification and qualification to MIL-PRF-38535

The case outline(s) are as designated in MIL-STD-1835 and as follows:

Outline letter Descriptive designator Terminals Package style X See figure 1 50 Flat pack

The lead finish is as specified in MIL-PRF-38535 for device classes Q and V or MIL-PRF-38535, appendix A for device class M.

Voltage range on VCC . . . . . . . . . . . . . . . . . . −1 V dc to +7 V dc Voltage range on any pin . . . . . . . . . . . . . . . . −1 V dc to +7 V dc Short circuit output current . . . . . . . . . . . . . . +50 mA Maximum power dissipation (PD) . . . . . . . . . . . . . 1 W Operating free-air temperature range TA . . . . . . . . . −55°C to +125°C Storage temperature range Tstg . . . . . . . . . . . . . −65°C to +150°C Lead temperature (soldering, 10 seconds) . . . . . . . . +300°C

Thermal resistance, junction-to-case (θJC) Case outline X . . . . . . . . . . . . . . . . . . . . 5°C/W 3/ Junction temperature (TJ) 4/ . . . . . . . . . . . . . . +175°C

Supply voltage range (VCC) . . . . . . . . . . . . . . . +4.5 V dc to +5.5 V dc Supply voltage (VSS) . . . . . . . . . . . . . . . . . . 0 V dc High-level input voltage (VIH) . . . . . . . . . . . . . +2.4 V dc minimum to +6.5 V dc maximum Low-level input voltage (VIL) 5/ . . . . . . . . . . . . −1.0 V dc minimum to +0.8 V dc maximum Transition time (tT) . . . . . . . . . . . . . . . . . . 3 ns minimum to 30 ns maximum Operating free-air temperature range (TA) . . . . . . . . −55°C to +125°C

Fault coverage measurement of manufacturing logic tests (MIL-STD-883, test method 5012) . . . . . . 100 percent

intended Use:

Microcircuits conforming to this drawing are intended for use for Government microcircuit applications (original equipment), design applications, and logistics purposes.

Microcircuits... View More

Document History

March 12, 2020
MICROCIRCUIT, MEMORY, DIGITAL, CMOS, 1 MEG X 16 DRAM, MONOLITHIC SILICON
Scope. This drawing documents two product assurance class levels consisting of high reliability (device class Q) and space application (device class V). A choice of case outlines and lead finishes...
August 18, 2014
MICROCIRCUIT, MEMORY, DIGITAL, CMOS, 1 MEG X 16 DRAM, MONOLITHIC SILICON
This drawing documents two product assurance class levels consisting of high reliability (device class Q) and space application (device class V). A choice of case outlines and lead finishes are...
April 19, 2006
MICROCIRCUIT, MEMORY, DIGITAL, CMOS, 1 MEG X 16 DRAM, MONOLITHIC SILICON
This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class V). A choice of case outlines and lead finishes...
SMD-5962-96743
February 28, 1996
MICROCIRCUIT, MEMORY, DIGITAL, CMOS, 1 MEG X 16 DRAM, MONOLITHIC SILICON
This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class V). A choice of case outlines and lead finishes...

References

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