DLA - SMD-5962-95609 REV C
MICROCIRCUIT, MEMORY, DIGITAL, CMOS, 64 X 36 X 2 CLOCKED FIFO, MONOLITHIC SILICON
inactive
| Organization: | DLA |
| Publication Date: | 28 April 2000 |
| Status: | inactive |
| Page Count: | 47 |
scope:
This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class V), and nontraditional performance environment (device class N). A choice of case outlines and lead finishes are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of Radiation Hardness Assurance (RHA) levels are reflected in the PIN. For device class N, the user is cautioned to assure that the device is appropriate for the application environment.
intended Use:
Microcircuits conforming to this drawing are intended for use for Government microcircuit applications (original equipment), design applications, and logistics purposes.
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Document History
June 10, 2016
MICROCIRCUIT, MEMORY, DIGITAL, CMOS, 64 x 36 x 2 CLOCKED FIFO, MONOLITHIC SILICON
This drawing documents two product assurance class levels consisting of high reliability (device classes Q) and space application (device class V) , and nontraditional performance environment (device...
December 13, 2007
MICROCIRCUIT, MEMORY, DIGITAL, CMOS, 64 X 36 X 2 CLOCKED FIFO, MONOLITHIC SILICON
This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class V) , and nontraditional performance environment...
March 28, 2002
MICROCIRCUIT, MEMORY, DIGITAL, CMOS, 64 X 36 X 2 CLOCKED FIFO, MONOLITHIC SILICON
A description is not available for this item.
SMD-5962-95609 REV C
April 28, 2000
MICROCIRCUIT, MEMORY, DIGITAL, CMOS, 64 X 36 X 2 CLOCKED FIFO, MONOLITHIC SILICON
This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class V), and nontraditional performance environment...
December 4, 1997
MICROCIRCUIT, MEMORY, DIGITAL, CMOS, 64 X 36 X 2 CLOCKED FIFO, MONOLITHIC SILICON
This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class V), and nontraditional performance environment...
April 12, 1996
MICROCIRCUIT, MEMORY, DIGITAL, CMOS, 64 X 36 X 2 CLOCKED FIFO, MONOLITHIC SILICON
This drawing documents three product assurance class levels consisting of space application (device class V), high reliability (device classes M and Q), and nontraditional performance environment...
November 3, 1995
MICROCIRCUIT, MEMORY, DIGITAL, CMOS, 64 X 36 X 2 CLOCKED FIFO, MONOLITHIC SILICON
This drawing forms a part of a one part - one part number documentation system (see 6.6 herein). Three product assurance classes consisting of space application (device class V), military high...