DLA - SMD-5962-96721 REV A
MICROCIRCUIT, DIGITAL, RADIATION HARDENED, ADVANCED CMOS, ERROR DETECTION AND CORRECTION CIRCUIT WITH THREE-STATE OUTPUTS, TTL COMPATIBLE INPUTS, MONOLITHIC SILICON
inactive
| Organization: | DLA |
| Publication Date: | 22 October 1997 |
| Status: | inactive |
| Page Count: | 21 |
Document History
July 3, 2000
MICROCIRCUIT, DIGITAL, RADIATION HARDENED, ADVANCED CMOS, ERROR DETECTION AND CORRECTION CIRCUIT WITH THREE-STATE OUTPUTS, TTL COMPATIBLE INPUTS, MONOLITHIC SILICON
Microcircuits conforming to this drawing are intended for use for Government microcircuit applications (original equipment), design applications, and logistics purposes.
Microcircuits covered by...
October 22, 1998
MICROCIRCUIT, DIGITAL, RADIATION HARDENED, ADVANCED CMOS, ERROR DETECTION AND CORRECTION CIRCUIT WITH THREE-STATE OUTPUTS, TTL COMPATIBLE INPUTS, MONOLITHIC SILICON
A description is not available for this item.
SMD-5962-96721 REV A
October 22, 1997
MICROCIRCUIT, DIGITAL, RADIATION HARDENED, ADVANCED CMOS, ERROR DETECTION AND CORRECTION CIRCUIT WITH THREE-STATE OUTPUTS, TTL COMPATIBLE INPUTS, MONOLITHIC SILICON
A description is not available for this item.
December 29, 1995
MICROCIRCUIT, DIGITAL, RADIATION HARDENED, ADVANCED CMOS, ERROR DETECTION AND CORRECTION CIRCUIT WITH THREE-STATE OUTPUTS, TTL COMPATIBLE INPUTS, MONOLITHIC SILICON
This drawing forms a part of a one part - one part number documentation system (see 6.6 herein). Two product assurance classes consisting of military high reliability (device classes Q and M) and...