JEDEC JESD 22-A108
Temperature, Bias, and Operating Life
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| Organization: | JEDEC |
| Publication Date: | 1 December 2000 |
| Status: | inactive |
| Page Count: | 11 |
Document History
November 1, 2022
Temperature, Bias, and Operating Life
This test is used to determine the effects of bias conditions and temperature on solid state devices over time. It simulates the devices’ operating condition in an accelerated way, and is primarily...
July 1, 2017
Temperature, Bias, and Operating Life
This test is used to determine the effects of bias conditions and temperature on solid state devices over time. It simulates the devices’ operating condition in an accelerated way, and is primarily...
December 1, 2016
Temperature, Bias, and Operating Life
This test is used to determine the effects of bias conditions and temperature on solid state devices over time. It simulates the devices’ operating condition in an accelerated way, and is primarily...
November 1, 2010
Temperature, Bias, and Operating Life
This test is used to determine the effects of bias conditions and temperature on solid state devices over time. It simulates the devices' operating condition in an accelerated way, and is primarily...
June 1, 2005
Temperature, Bias, and Operating Life
A revised method for determining the effects of bias conditions and temperature, over time, on solid state devices is now available. Revision B of A108 includes low temperature operating life (LTOL)...
JEDEC JESD 22-A108
December 1, 2000
Temperature, Bias, and Operating Life
A description is not available for this item.
March 1, 1991
Bias Life (Revision of Test Method A108 - Previously Published in JESD22)
A description is not available for this item.