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DLA - SMD-5962-98661 REV B

MICROCIRCUIT, DIGITAL, FLOATING-POINT DIGITAL SIGNAL PROCESSOR, MONOLITHIC SILICON

inactive
Organization: DLA
Publication Date: 4 May 2001
Status: inactive
Page Count: 49

Document History

SMD-5962-98661 REV G
November 21, 2023
MICROCIRCUIT, DIGITAL, FLOATING-POINT DIGITAL SIGNAL PROCESSOR, MONOLITHIC SILICON
A description is not available for this item.
SMD 5962-98661
July 24, 2018
MICROCIRCUIT, DIGITAL, FLOATING-POINT DIGITAL SIGNAL PROCESSOR, MONOLITHIC SILICON
This drawing documents two product assurance class levels consisting of high reliability (device classes Q) and space application (device class V). A choice of case outlines and lead finishes are...
SMD 5962-98661
July 28, 2009
MICROCIRCUIT, DIGITAL, FLOATING-POINT DIGITAL SIGNAL PROCESSOR, MONOLITHIC SILICON
This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class V). A choice of case outlines and lead finishes...
SMD 5962-98661
November 12, 2008
MICROCIRCUIT, DIGITAL, FLOATING-POINT DIGITAL SIGNAL PROCESSOR, MONOLITHIC SILICON
This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class V). A choice of case outlines and lead finishes...
SMD-5962-98661 REV C
July 6, 2004
MICROCIRCUIT, DIGITAL, FLOATING-POINT DIGITAL SIGNAL PROCESSOR, MONOLITHIC SILICON
A description is not available for this item.
SMD-5962-98661 REV B
May 4, 2001
MICROCIRCUIT, DIGITAL, FLOATING-POINT DIGITAL SIGNAL PROCESSOR, MONOLITHIC SILICON
A description is not available for this item.
SMD-5962-98661 REV A
March 23, 2001
MICROCIRCUIT, DIGITAL, FLOATING-POINT DIGITAL SIGNAL PROCESSOR, MONOLITHIC SILICON
A description is not available for this item.
SMD-5962-98661
March 3, 2000
MICROCIRCUIT, DIGITAL, FLOATING-POINT DIGITAL SIGNAL PROCESSOR, MONOLITHIC SILICON
Microcircuits conforming to this drawing are intended for use for Government microcircuit applications (original equipment), design applications, and logistics purposes. Microcircuits covered by...
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References

This document references:
IEEE 1149.1 - Test Access Port and Boundary-Scan Architecture
Published by IEEE on February 6, 2013
This standard defines test logic that can be included in an integrated circuit to provide standardized approaches to: - Testing the interconnections between integrated circuits once they have been...
This document references:
MIL-STD-1835 - Electronic Component Case Outlines
Published by NPFC on September 21, 2009
This standard establishes and maintains a compilation of electronic component case outlines and should be useful to all levels of manufacturing that culminate in the production of reliable and...
This document references:
MIL-HDBK-103 - LIST OF STANDARD MICROCIRCUIT DRAWINGS
Published by NPFC on March 8, 2021
Purpose. The Standard Microcircuit Drawing Program (SMDP) is directly under the auspices of the DoD Parts Management Program (PMP). The PMP is implemented by MIL-HDBK-512, "Parts Management." The PMP...
This document references:
MIL-HDBK-780D VALID NOTICE 1 - Standard Microcircuit Drawings
Published by DLA on December 28, 2021
A description is not available for this item.
This document references:
MIL-PRF-38535M - INTEGRATED CIRCUITS (MICROCIRCUITS) MANUFACTURING, GENERAL SPECIFICATION FOR
Published by DLA on November 1, 2022
Scope. This specification establishes the general performance requirements for integrated circuits or microcircuits and the quality and reliability assurance requirements, which are to be met for...
This document references:
MIL-STD-883 - TEST METHOD STANDARD MICROCIRCUITS
Published by NPFC on September 16, 2019
Purpose. This standard establishes uniform methods, controls, and procedures for testing microelectronic devices suitable for use within Military and Aerospace electronic systems including basic...
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