DLA - SMD-5962-96582 REV A
MICROCIRCUIT, DIGITAL, RADIATION HARDENED, ADVANCED CMOS, 9-BIT ODD/EVEN PARITY GENERATOR/CHECKER, MONOLITHIC SILICON
inactive
| Organization: | DLA |
| Publication Date: | 18 November 1996 |
| Status: | inactive |
| Page Count: | 16 |
Document History
December 5, 2019
MICROCIRCUIT, DIGITAL, RADIATION HARDENED, ADVANCED CMOS, 9-BIT ODD/EVEN PARITY GENERATOR/CHECKER, MONOLITHIC SILICON
Scope.
This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class V). A choice of case outlines and lead...
March 22, 2012
MICROCIRCUIT, DIGITAL, RADIATION HARDENED, ADVANCED CMOS, 9-BIT ODD/EVEN PARITY GENERATOR/CHECKER, MONOLITHIC SILICON
This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class V). A choice of case outlines and lead finishes...
March 20, 2006
MICROCIRCUIT, DIGITAL, RADIATION HARDENED, ADVANCED CMOS, 9-BIT ODD/EVEN PARITY GENERATOR/CHECKER, MONOLITHIC SILICON
This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class V). A choice of case outlines and lead finishes...
SMD-5962-96582 REV A
November 18, 1996
MICROCIRCUIT, DIGITAL, RADIATION HARDENED, ADVANCED CMOS, 9-BIT ODD/EVEN PARITY GENERATOR/CHECKER, MONOLITHIC SILICON
A description is not available for this item.
May 20, 1996
MICROCIRCUIT, DIGITAL, RADIATION HARDENED, ADVANCED CMOS, 9-BIT ODD/EVEN PARITY GENERATOR/CHECKER, MONOLITHIC SILICON
This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class V). A choice of case outlines and lead finishes...