BSI - BS EN 60444-2
Measurement of Quartz Crystal Unit Parameters by Zero Phase Technique in a pi-Network - Part 2: Phase Offset Method for Measurement of Motional Capacitance of Quartz Crystal Units
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| Organization: | BSI |
| Publication Date: | 15 September 1993 |
| Status: | active |
| Page Count: | 16 |
| ICS Code (Piezoelectric devices): | 31.140 |
Document History
BS EN 60444-2
September 15, 1993
Measurement of Quartz Crystal Unit Parameters by Zero Phase Technique in a pi-Network - Part 2: Phase Offset Method for Measurement of Motional Capacitance of Quartz Crystal Units
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