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BSI - BS 6493-2.3

Semiconductor Devices *- Part 2: Integrated Circuits - Section 2.3: Recommendations for Analogue Integrated Circuits

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Organization: BSI
Publication Date: 30 January 1987
Status: active
Page Count: 140
ICS Code (Integrated circuits. Microelectronics): 31.200

Document History

BS 6493-2.3
January 30, 1987
Semiconductor Devices *- Part 2: Integrated Circuits - Section 2.3: Recommendations for Analogue Integrated Circuits
A description is not available for this item.
BS 6493-2.3
January 30, 1987
Semiconductor Devices Part 2: Integrated Circuits Section 2.3: Recommendations for Analogue Integrated Circuits
A description is not available for this item.
BS 6493-2.3
January 30, 1987
Semiconductor Devices Part 2: Integrated Circuits Section 2.3: Recommendations for Analogue Integrated Circuits
A description is not available for this item.
BS 6493-2.3
January 30, 1987
Semiconductor Devices Part 2: Integrated Circuits Section 2.3: Recommendations for Analogue Integrated Circuits
A description is not available for this item.

References

This document references:
IEC 60747-7 - Semiconductor devices – Discrete devices – Part 7: Bipolar transistors
Published by IEC on September 1, 2019
This part of IEC 60747-7 gives the requirements applicable to the following sub-categories of bipolar transistors excluding microwave transistors. – Small signal transistors (excluding switching and...
This document is referenced by:
BS CECC 90300 - Sectional Specification: Interface Monolithic Integrated Circuits
Published by BSI on June 30, 1988
General details, quality assessment procedures, test and measurement procedures and a common blank detail specification. To be read in conjunction with BS CECC 90000:1991
This document is referenced by:
BS CECC 90200 - Harmonized System of Quality Assessment for Electronic Components: Sectional Specification: Analogue Monolithic Integrated Circuits
Published by BSI on February 29, 1988
Provides general details, quality assessment, test and measurement procedures and a common blank detail specification.
This document is referenced by:
BS IEC 60747-10 - Semiconductor devices - Generic specification for discrete devices and integrated circuits
Published by BSI on September 30, 1991
General procedures for quality assessment to be used in the IECQ system and general rules for measurement methods of electrical characteristics, climatic and mechanical tests and endurance tests.
This document is referenced by:
BS CECC 90115 - Harmonized System of Quality Assessment for Electronic Components Blank Detail Specification Digital Array Integrated Circuits
Published by BSI on May 15, 1994
A description is not available for this item.
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