JEDEC JESD 74
Early Life Failure Rate Calculation Procedure for Electronic Components
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| Organization: | JEDEC |
| Publication Date: | 1 April 2000 |
| Status: | inactive |
| Page Count: | 15 |
Document History
February 1, 2007
Early Life Failure Rate Calculation Procedure for Semiconductor Components
This standard defines methods for calculating the early life failure rate of a product, using accelerated testing, whose failure rate is constant or decreasing over time. For technologies where there...
JEDEC JESD 74
April 1, 2000
Early Life Failure Rate Calculation Procedure for Electronic Components
A description is not available for this item.