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JEDEC JESD 74

Early Life Failure Rate Calculation Procedure for Semiconductor Components

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Organization: JEDEC
Publication Date: 1 February 2007
Status: active
Page Count: 38
scope:

This standard defines methods for calculating the early life failure rate of a product, using accelerated testing, whose failure rate is constant or decreasing over time. For technologies where there is adequate field failure data, alternative methods may be used to establish the early life failure rate. The purpose of this standard is to define a procedure for performing measurement and calculation of early life failure rates. Projections can be used to compare reliability performance with objectives, provide line feedback, support service cost estimates, and set product test and screen strategies to ensure that the ELFR meets customers' requirements.

Document History

JEDEC JESD 74
February 1, 2007
Early Life Failure Rate Calculation Procedure for Semiconductor Components
This standard defines methods for calculating the early life failure rate of a product, using accelerated testing, whose failure rate is constant or decreasing over time. For technologies where there...
April 1, 2000
Early Life Failure Rate Calculation Procedure for Electronic Components
A description is not available for this item.

References

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