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DOD - SMD 5962-93196

MICROCIRCUIT, DIGITAL, CMOS, LOW SKEW PLL CLOCK DRIVER, MONOLITHIC SILICON

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Organization: DOD
Publication Date: 3 March 1994
Status: inactive
Page Count: 20
scope:

This drawing forms a part of a one part - one part number documentation system (see 6.6 herein). Two product assurance classes consisting of military high reliability (device classes Q and M) and space application (device class V), and a choice of case outlines and lead finishes are available and are reflected in the Part or Identifying Number (PIN). Device class M microcircuits represent non-JAN class B microcircuits in accordance with 1.2.1 of MIL-STD-883, "Provisions for the use of MIL-STD-883 in conjunction with compliant non-JAN devices". When available, a choice of Radiation Hardness Assurance (RHA) levels are reflected in the PIN.

The PIN shall be as shown in the following example:

Device class M RHA marked devices shall meet the MIL-I-38535 appendix A specified RHA levels and shall be marked with the appropriate RHA designator. Device classes Q and V RHA marked devices shall meet the MIL-I-38535 specified RHA levels and shall be marked with the appropriate RHA designator. A dash (-) indicates a non-RHA device.

The device type(s) shall identify the circuit function as follows:

Maximum Device type Generic number Circuit function clock frequency 01 88915 Low skew CMOS PLL clock driver 55 MHz

The device class designator shall be a single letter identifying the product assurance level as follows:

Device class Device requirements documentation M Vendor self-certification to the requirements for non-JAN class B microcircuits in accordance with 1.2.1 of MIL-STD-883 Q or V Certification and qualification to MIL-I-38535

The case outline(s) shall be as designated in MIL-STD-1835 and as follows:

Outline letter Descriptive designator Terminals Package style Y see figure 1 28 Quad flat pack Z see figure 2 29 Pin grid array

The lead finish shall be as specified in MIL-STD-883 (see 3.1 herein) for class M or MIL-I-38535 for classes Q and V. Finish letter "X" shall not be marked on the microcircuit or its packaging. The "X" designation is for use in specifications when lead finishes A, B, and C are considered acceptable and interchangeable without preference.

Supply voltage range (referenced to GND), VCC . . . . . . −0.5 V dc to 6.0 V dc Input voltage range (referenced to GND), VI . . . . . . . −0.5 V dc to VCC + 0.5 V dc Output voltage range (referenced to GND), VO . . . . . . −0.5 V dc to VCC + 0.5 V dc Output current (per pin), IO . . . . . . . . . . . . . . ±50 mA Supply current, VCC or GND . . . . . . . . . . . . . . . ±100 mA Power dissipation, PD . . . . . . . . . . . . . . . . . . 300 mW Storage temperature range . . . . . . . . . . . . . . . . −65°C to +150°C Lead temperature (soldering, 10 seconds) . . . . . . . . +300°C Junction temperature, continuous, TJ . . . . . . . . . . +175°C Thermal resistance, junction-to-case, θJC; Case Y . . . . . . . . . . . . . . . . . . . . . . . . 1.50°C/W Case Z . . . . . . . . . . . . . . . . . . . . . . . . 6.74°C/W

Supply voltage range (referenced to GND), VCC . . . . . . 4.5 V dc to 5.5 V dc Input voltage range (referenced to GND), VI . . . . . . . 0 V dc to VCC Output voltage range (referenced to GND), VO . . . . . . 0 V dc to VCC Case operating temperature range, TC . . . . . . . . . . −55°C to +125°C Input rise and fall time range (SYNC input), tr, tf . . . 0 ns to 3.0 ns/V

Fault coverage measurement of manufacturing logic tests (MIL-STD-883, test method 5012) . . . . . . 2/

intended Use:

Microcircuits conforming to this drawing are intended for use for Government microcircuit applications (original equipment), design applications, and logistics purposes.

Microcircuits... View More

Document History

March 8, 2018
MICROCIRCUIT, DIGITAL, CMOS, LOW SKEW PLL CLOCK DRIVER, MONOLITHIC SILICON
This drawing documents two product assurance class levels consisting of high reliability (device class Q) and space application (device class V). A choice of case outlines and lead finishes are...
November 29, 2017
MICROCIRCUIT, DIGITAL, CMOS, LOW SKEW PLL CLOCK DRIVER, MONOLITHIC SILICON
This drawing documents two product assurance class levels consisting of high reliability (device class Q) and space application (device class V). A choice of case outlines and lead finishes are...
December 10, 2009
MICROCIRCUIT, DIGITAL, CMOS, LOW SKEW PLL CLOCK DRIVER, MONOLITHIC SILICON
This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class V). A choice of case outlines and lead finishes...
SMD 5962-93196
March 3, 1994
MICROCIRCUIT, DIGITAL, CMOS, LOW SKEW PLL CLOCK DRIVER, MONOLITHIC SILICON
This drawing forms a part of a one part - one part number documentation system (see 6.6 herein). Two product assurance classes consisting of military high reliability (device classes Q and M) and...

References

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