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DLA - SMD-5962-97633 REV B

MICROCIRCUIT, LINEAR, DUAL, LOW POWER, JFET INPUT OPERATIONAL AMPLIFIER, MONOLITHIC SILICON

inactive
Organization: DLA
Publication Date: 23 January 2006
Status: inactive
Page Count: 11
scope:

This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class V). A choice of case outlines and lead finishes are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of Radiation Hardness Assurance (RHA) levels is reflected in the PIN.

 

intended Use:

Microcircuits conforming to this drawing are intended for use for Government microcircuit applications (original equipment), design applications, and logistics purposes.

Document History

January 3, 2018
MICROCIRCUIT, LINEAR, DUAL, LOW POWER, JFET INPUT OPERATIONAL AMPLIFIER, MONOLITHIC SILICON
This drawing documents two product assurance class levels consisting of high reliability (device class Q) and space application (device class V). A choice of case outlines and lead finishes are...
February 7, 2012
MICROCIRCUIT, LINEAR, DUAL, LOW POWER, JFET INPUT OPERATIONAL AMPLIFIER, MONOLITHIC SILICON
This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class V). A choice of case outlines and lead finishes...
SMD-5962-97633 REV B
January 23, 2006
MICROCIRCUIT, LINEAR, DUAL, LOW POWER, JFET INPUT OPERATIONAL AMPLIFIER, MONOLITHIC SILICON
This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class V). A choice of case outlines and lead finishes...
July 11, 2001
MICROCIRCUIT, LINEAR, DUAL, LOW POWER, JFET INPUT OPERATIONAL AMPLIFIER, MONOLITHIC SILICON
A description is not available for this item.
August 27, 1997
MICROCIRCUIT, LINEAR, DUAL, LOW POWER, JFET INPUT OPERATIONAL AMPLIFIER, MONOLITHIC SILICON
This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class V). A choice of case outlines and lead finishes...

References

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