DLA - SMD-5962-90696
MICROCIRCUIT, MEMORY, DIGITAL, CMOS, 256 X 4 STATIC RANDOM ACCESS MEMORY (SRAM) WITH SEPERATE I/O, MONOLITHIC SILICON
| Organization: | DLA |
| Publication Date: | 4 March 1993 |
| Status: | inactive |
| Page Count: | 21 |
scope:
This drawing forms a part of a one part - one part number documentation system (see 6.6 herein). Two product assurance classes consisting of military high reliability (device classes B, Q, and M) and space application (device classes S and V) and a choice of case outlines and lead finishes are available and are reflected in the Part or Identifying Number (PIN). Device class M microcircuits represent non-JAN class B microcircuits in accordance with 1.2.1 of MIL-STD-883, "Provisions for the use of MIL-STD-883 in conjunction with compliant non-JAN devices". When available, a choice of radiation hardness assurance (RHA) levels are reflected in the PIN.
The PIN shall be as shown in the following example:
Device classes M, B, and S RHA marked devices shall meet the MIL-M-38510 specified RHA levels and shall be marked with the appropriate RHA designator. Device classes Q and V devices shall meet or exceed the electrical performance characteristics specified in table I herein after exposure to the specified irradiation levels specified in the absolute maximum ratings herein and the RHA marked device shall be marked in accordance with MIL-I-38535. A dash (-) indicates a non-RHA device.
The device type(s) shall identify the circuit function as follows:
Device type Generic number Circuit function Access time 01 7C123 256 × 4 SRAM Separate I/O 15 ns 02 7C123 256 × 4 SRAM Separate I/O 12 ns 03 7C123 256 × 4 SRAM Separate I/O 10 ns
The device class designator shall be a single letter identifying the product assurance level as follows:
Device class Device requirements documentation M Vendor self-certification to the requirements for non-JAN class B microcircuits in accordance with 1.2.1 of MIL-STD-883 B or S Certification and qualification to MIL-M-38510 Q or V Certification and qualification to MIL-I-38535
The Case outline(s) shall be as designated in MIL-STD-1835 and as follows:
Outline letter Descriptive designator Terminals Package style K GDFP2-F24 or CDFP3-F24 24 Flat pack L GDIP3-T24 or CDIP4-T24 24 Dual-in-line X See figure 1 24 Rectangular leadless chip carrier
The lead finish shall be as specified in MIL-M-38510 for classes M, B, and S or MIL-I-38535 for classes Q and V. Finish letter "X" shall not be marked on the microcircuit or its packaging. The "X" designation is for use in specifications when lead finishes A, B, and C are considered acceptable and interchangeable without preference.
Supply voltage range to ground potential (VCC) - - - - - −0.5 V dc to +7.0 V dc DC voltage range applied to the outputs in the high Z state - - - - - - - - - - - - - - - - - −0.5 V dc to +7.0 V dc DC input voltage range - - - - - - - - - - - - - - - - −0.5 V dc to +7.0 V dc DC output current - - - - - - - - - - - - - - - - - - - 20 mA Maximum power dissipation - - - - - - - - - - - - - - 1.0 W Lead temperature (soldering, 10 seconds) - - - - - - - - +260°C Thermal resistance, junction-to-case (θJC): Case outlines K and L - - - - - - - - - - - - - - - - See MIL-STD-1835 Case outline X - - - - - - - - - - - - - - - - - - - 20°C/W 2/ Junction temperature (TJ) - - - - - - - - - - - - - - - +175°C Storage temperature range - - - - - - - - - - - - - - - −65°C to +150°C
Supply voltage range (VCC)- - - - - - - - - - - - - +4.5 V dc minimum to +5.5 V dc maximum Ground voltage (GND)- - - - - - - - - - - - - - - - 0 V dc Input high voltage range (VIH)- - - - - - - - - - - 2.2 V dc to VCC V dc Input low voltage range (VIL) - - - - - - - - - - - −0.8 V dc to 0.8 V dc 3/ Case operating temperature range (TC) - - - - - - - −55°C to +125°c
Fault coverage measurement of manufacturing logic tests (MIL-STD-883, test method 5012) - - - - - 4/ percent
intended Use:
Microcircuits conforming to this drawing are intended for use for government microcircuit applications (original equipment), design applications, and logistics purposes.
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