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DLA - SMD-5962-87739 REV C

MICROCIRCUIT, LINEAR, QUAD, VOLTAGE COMPARATOR, RADIATION HARDENED, MONOLITHIC SILICON

inactive
Organization: DLA
Publication Date: 17 December 1997
Status: inactive
Page Count: 15
scope:

This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M and space application (device class V). A choice of case outlines and lead finishes are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of Radiation Hardness Assurance (RHA) levels are reflected in the PIN.

The PIN is as shown in the following examples.

For device classes M and Q:

For device class V:

Device classes Q and V RHA marked devices meet the MIL-PRF-38535 specified RHA levels and are marked with the appropriate RHA designator. Device class M RHA marked devices meet the MIL-PRF-38535, appendix A specified RHA levels and are marked with the appropriate RHA designator. A dash (-) indicates a non-RHA device.

The device type(s) identify the circuit function as follows:

Device type Generic number Circuit function 01 LM139A Quad voltage comparator

The device class designator is a single letter identifying the product assurance level as listed below. Since the device class designator has been added after the original issuance of this drawing, device classes M and Q designators will not be included in the PIN and will not be marked on the device.

Device class Device requirements documentation M Vendor self-certification to the requirements for MIL-STD-883 compliant, non-JAN class level B microcircuits in accordance with MIL-PRF-38535, appendix A Q or V Certification and qualification to MIL-PRF-38535

The case outline(s) are as designated in MIL-STD-1835 and as follows:

Outline letter Descriptive designator Terminals Package style C GDIP1-T14 or CDIP2-T14 14 Dual-in-line D GDFP1-F14 or CDFP2-F14 14 Flat pack X See figure 1 14 Flat pack 2 CQCC1-N20 20 Square leadless chip carrier

The lead finish is as specified in MIL-PRF-38535 for device classes Q and V or MIL-PRF-38535, appendix A for device class M.

Supply voltage range ...........................36 V dc or ±18 V dc Input voltage range ............................−0.3 V dc to 36 Vdc Input current (VIN < −0.3 V)....................50 mA Maximum power dissipation (PD) .................900 mW 2/ Sink current ...................................20 mA approximately Lead temperature (soldering 10 seconds) ........300°C Storage temperature ............................−65°C to +150°C Junction temperature (TJ).......................150°C Thermal resistance, junction-to-case (ΘJC): Cases C, D, and 2 ............................See MIL-STD-1835 Case X .......................................23°C/W

Supply voltage ............................... 5 V dc to 30 V dc Ambient operating temperature range (TA) .......−55°C to +125°C

intended Use:

Microcircuits conforming to this drawing are intended for use for Government microcircuit applications (original equipment), design applications, and logistics purposes.

Microcircuits... View More

Document History

April 7, 2021
MICROCIRCUIT, LINEAR, QUAD, VOLTAGE COMPARATOR, RADIATION HARDENED, MONOLITHIC SILICON
Scope. This drawing documents two product assurance class levels consisting of high reliability (device class Q and M) and space application (device class V). A choice of case outlines and lead...
March 8, 2018
MICROCIRCUIT, LINEAR, QUAD, VOLTAGE COMPARATOR, RADIATION HARDENED, MONOLITHIC SILICON
This drawing documents two product assurance class levels consisting of high reliability (device class Q and M) and space application (device class V). A choice of case outlines and lead finishes are...
May 25, 2011
MICROCIRCUIT, LINEAR, QUAD, VOLTAGE COMPARATOR, RADIATION HARDENED, MONOLITHIC SILICON
This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class V). A choice of case outlines and lead finishes...
July 6, 2007
MICROCIRCUIT, LINEAR, QUAD, VOLTAGE COMPARATOR, RADIATION HARDENED, MONOLITHIC SILICON
This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class V). A choice of case outlines and lead finishes...
August 8, 2002
MICROCIRCUIT, LINEAR, QUAD, VOLTAGE COMPARATOR, RADIATION HARDENED, MONOLITHIC SILICON
A description is not available for this item.
February 10, 1999
MICROCIRCUIT, LINEAR, QUAD, VOLTAGE COMPARATOR, RADIATION HARDENED, MONOLITHIC SILICON
This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class V). A choice of case outlines and lead finishes...
October 29, 1998
MICROCIRCUIT, LINEAR, QUAD, VOLTAGE COMPARATOR, RADIATION HARDENED, MONOLITHIC SILICON
This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class V). A choice of case outlines and lead finishes...
June 17, 1998
MICROCIRCUIT, LINEAR, QUAD, VOLTAGE COMPARATOR, RADIATION HARDENED, MONOLITHIC SILICON
This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class V). A choice of case outlines and lead finishes...
SMD-5962-87739 REV C
December 17, 1997
MICROCIRCUIT, LINEAR, QUAD, VOLTAGE COMPARATOR, RADIATION HARDENED, MONOLITHIC SILICON
This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M and space application (device class V). A choice of case outlines and lead finishes...
June 9, 1997
MICROCIRCUIT, LINEAR, QUAD, VOLTAGE COMPARATOR, RADIATION HARDENED, MONOLITHIC SILICON
This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class V). A choice of case outlines and lead finishes...
September 24, 1992
MICROCIRCUIT, LINEAR, QUAD, VOLTAGE COMPARATOR, RADIATION HARDENED, MONOLITHIC SILICON
This drawing describes device requirements for class B microcircuits in accordance with 1.2.1 of MIL-STD-883, "Provisions for the use of MIL-STD-883 in conjunction with compliant non-JAN devices"....
April 24, 1988
MICROCIRCUIT, LINEAR, QUAD, VOLTAGE COMPARATOR, RADIATION HARDENED, MONOLITHIC SILICON
A description is not available for this item.
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