DS/EN 60749-12
Semiconductor devices – Mechanical and climatic test methods – Part 12: Vibration, variable frequency
inactive
| Organization: | DS |
| Publication Date: | 26 August 2002 |
| Status: | inactive |
| Page Count: | 10 |
| ICS Code (Semiconductor devices in general): | 31.080.01 |
scope:
This part of IEC 60749 describes a test to determine the effect of variable frequency vibration, within the specified frequency range, on internal structural elements. This is a destructive test. It is normally appllicable to cavity-type packages. In general, this variable frequency vibration test is in conformity with IEC 60068-2-6 but, due to specific requirements of semiconductors, the clauses of this standard apply.
Document History
December 23, 2003
Semiconductor devices – Mechanical and climatic test methods – Part 12: Vibration, variable frequency
This part of IEC 60749 describes a test to determine the effect of variable frequency vibration, within the specified frequency range, on internal structural elements. This is a destructive test. It...
DS/EN 60749-12
August 26, 2002
Semiconductor devices – Mechanical and climatic test methods – Part 12: Vibration, variable frequency
This part of IEC 60749 describes a test to determine the effect of variable frequency vibration, within the specified frequency range, on internal structural elements. This is a destructive test. It...
Semiconductor devices – Mechanical and climatic test methods – Part 12: Vibration, variable frequency
This part of IEC 60749 describes a test to determine the effect of variable frequency vibration, within the specified frequency range, on internal structural elements. This is a destructive test. It...
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