IEC 61000-4-24
Electromagnetic Compatibility (EMC) - Part 4: Testing and Measurement Techniques - Section 24: Test Methods for Protective Devices for HEMP Conducted Disturbance Basic EMC Publication
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| Organization: | IEC |
| Publication Date: | 1 February 1997 |
| Status: | inactive |
| Page Count: | 32 |
| ICS Code (Electromagnetic compatibility (EMC)): | 33.100 |
scope:
This section of IEC 61000-4 deals with methods for testing protective devices for HEMP conducted disturbance. It primarily covers testing of voltage breakdown and voltage-limiting characteristics but also methods to measure the residual voltage under HEMP conditions for the case of very fast changes of voltage (u) and current (i) as a function of time.
Document History
August 1, 2023
Electromagnetic compatibility (EMC) – Part 4-24: Testing and measurement techniques – Test methods for protective devices for HEMP conducted disturbance
This part of IEC 61000 deals with methods for testing protective devices for HEMP conducted disturbance. It includes two-terminal elements, such as gas discharge tubes, varistors, and two-port SPDs,...
August 1, 2023
AMENDMENT 1 Electromagnetic compatibility (EMC) – Part 4-24: Testing and measurement techniques – Test methods for protective devices for HEMP conducted disturbance
A description is not available for this item.
November 1, 2015
Electromagnetic compatibility (EMC) – Part 4-24: Testing and measurement techniques – Test methods for protective devices for HEMP conducted disturbance
This part of IEC 61000 deals with methods for testing protective devices for HEMP conducted disturbance. It includes two-terminal elements, such as gas discharge tubes, varistors, and two-port SPDs,...
IEC 61000-4-24
February 1, 1997
Electromagnetic Compatibility (EMC) - Part 4: Testing and Measurement Techniques - Section 24: Test Methods for Protective Devices for HEMP Conducted Disturbance Basic EMC Publication
This section of IEC 61000-4 deals with methods for testing protective devices for HEMP conducted disturbance. It primarily covers testing of voltage breakdown and voltage-limiting characteristics but...