CENELEC - EN 60749-13
Semiconductor Devices Mechanical and Climatic Test Methods Part 13: Salt Atmosphere
inactive
| Organization: | CENELEC |
| Publication Date: | 28 August 2002 |
| Status: | inactive |
| Page Count: | 10 |
| ICS Code (Semiconductor devices in general): | 31.080.01 |
Document History
April 1, 2018
Semiconductor devices - Mechanical and climatic test methods - Part 13: Salt atmosphere
This part of IEC 60749 describes a salt atmosphere test that determines the resistance of semiconductor devices to corrosion. It is an accelerated test that simulates the effects of severe sea-coast...
EN 60749-13
August 28, 2002
Semiconductor Devices Mechanical and Climatic Test Methods Part 13: Salt Atmosphere
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