CENELEC - EN IEC 60749-13
Semiconductor devices - Mechanical and climatic test methods - Part 13: Salt atmosphere
active, Most Current
| Organization: | CENELEC |
| Publication Date: | 1 April 2018 |
| Status: | active |
| Page Count: | 20 |
| ICS Code (Semiconductor devices in general): | 31.080.01 |
scope:
This part of IEC 60749 describes a salt atmosphere test that determines the resistance of semiconductor devices to corrosion. It is an accelerated test that simulates the effects of severe sea-coast atmosphere on all exposed surfaces. It is only applicable to those devices specified for a marine environment.
The salt atmosphere test is considered destructive.
Document History
EN IEC 60749-13
April 1, 2018
Semiconductor devices - Mechanical and climatic test methods - Part 13: Salt atmosphere
This part of IEC 60749 describes a salt atmosphere test that determines the resistance of semiconductor devices to corrosion. It is an accelerated test that simulates the effects of severe sea-coast...
August 28, 2002
Semiconductor Devices Mechanical and Climatic Test Methods Part 13: Salt Atmosphere
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