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BSI - BS EN 60749-27

Semiconductor devices - Mechanical and climatic test methods - Part 27: Electrostatic discharge (ESD) sensitivity testing - Machine model (MM)

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Organization: BSI
Publication Date: 29 September 2006
Status: inactive
Page Count: 16
ICS Code (Semiconductor devices in general): 31.080.01

Document History

BS EN 60749-27
September 29, 2006
Semiconductor devices - Mechanical and climatic test methods - Part 27: Electrostatic discharge (ESD) sensitivity testing - Machine model (MM)
A description is not available for this item.
BS EN 60749-27
September 29, 2006
Semiconductor devices - Mechanical and climatic test methods - Part 27: Electrostatic discharge (ESD) sensitivity testing - Machine model (MM)
A description is not available for this item.

References

This document references:
BS EN IEC 60749-26 - Semiconductor devices - Mechanical and climatic test methods Part 26: Electrostatic discharge (ESD) sensitivity testing - Human body model (HBM)
Published by BSI on April 30, 2018
A description is not available for this item.
This document references:
IEC 61340-3-2 - Electrostatics – Part 3-2: Methods for simulation of electrostatic effects – Machine model (MM) electrostatic discharge test waveforms
Published by IEC on December 1, 2006
This part of IEC 61340 describes the discharge current waveforms used to simulate machine model (MM) electrostatic discharges (ESD) and the basic requirements for equipment used to develop and verify...
This document is referenced by:
BS EN 61340-3-2 - Electrostatics - Part 3-2: Methods for simulation of electrostatic effects - Machine model (MM) electrostatic discharge test waveforms
Published by BSI on April 30, 2007
A description is not available for this item.
This document is referenced by:
BS EN 62258-1 - Semiconductor die products Part 1: Procurement and use
Published by BSI on November 30, 2010
A description is not available for this item.
This document is referenced by:
BS EN 61340-5-1 - Electrostatics Part 5-1: Protection of electronic devices from electrostatic phenomena - General requirements
Published by BSI on December 31, 2016
A description is not available for this item.
This document is referenced by:
BS EN 62047-5 - Semiconductor devices - Micro-electromechanical devices Part 5: RF MEMS switches
Published by BSI on September 30, 2011
A description is not available for this item.
This document is referenced by:
BS EN 61340-3-2 - Electrostatics - Part 3-2: Methods for simulation of electrostatic effects - Machine model (MM) electrostatic discharge test waveforms
Published by BSI on April 30, 2007
A description is not available for this item.
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