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BSI - BS IEC 61649

Procedures for Goodness-of-Fit Tests, Confidence Intervals and Lower Confidence Limits for Weibull Distributed Data

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Organization: BSI
Publication Date: 15 September 1997
Status: inactive
Page Count: 16
ICS Code (Characteristics and design of machines, apparatus, equipment): 21.020
ICS Code (Application of statistical methods): 03.120.30
ICS Code (Electrical engineering in general): 29.020

Document History

February 28, 2009
Weibull analysis
A description is not available for this item.
BS IEC 61649
September 15, 1997
Procedures for Goodness-of-Fit Tests, Confidence Intervals and Lower Confidence Limits for Weibull Distributed Data
A description is not available for this item.

References

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