BSI - BS IEC 61649
Procedures for Goodness-of-Fit Tests, Confidence Intervals and Lower Confidence Limits for Weibull Distributed Data
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| Organization: | BSI |
| Publication Date: | 15 September 1997 |
| Status: | inactive |
| Page Count: | 16 |
| ICS Code (Characteristics and design of machines, apparatus, equipment): | 21.020 |
| ICS Code (Application of statistical methods): | 03.120.30 |
| ICS Code (Electrical engineering in general): | 29.020 |
Document History
BS IEC 61649
September 15, 1997
Procedures for Goodness-of-Fit Tests, Confidence Intervals and Lower Confidence Limits for Weibull Distributed Data
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