DLA - SMD-5962-96757
MICROCIRCUIT, DIGITAL, RADIATION HARDENED, CMOS, 4-BIT MAGNITUDE COMPARATOR, MONOLITHIC SILICON
inactive
| Organization: | DLA |
| Publication Date: | 19 January 1996 |
| Status: | inactive |
| Page Count: | 16 |
Document History
June 18, 2021
MICROCIRCUIT, DIGITAL, RADIATION HARDENED, CMOS, 4-BIT MAGNITUDE COMPARATOR, M ONOLITHIC SILICON
Scope.
This drawing documents two product assurance class levels consisting of high reliability (device classes Q) and space application (device class V). A choice of case outlines and lead finishes...
September 23, 2015
MICROCIRCUIT, DIGITAL, RADIATION HARDENED, CMOS, 4-BIT MAGNITUDE COMPARATOR, MONOLITHIC SILICON
This drawing documents two product assurance class levels consisting of high reliability (device classes Q) and space application (device class V). A choice of case outlines and lead finishes are...
January 23, 2008
MICROCIRCUIT, DIGITAL, RADIATION HARDENED, CMOS, 4-BIT MAGNITUDE COMPARATOR, MONOLITHIC SILICON
This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class V). A choice of case outlines and lead finishes...
July 13, 2000
MICROCIRCUIT, DIGITAL, RADIATION HARDENED, CMOS, 4-BIT MAGNITUDE COMPARATOR, MONOLITHIC SILICON
A description is not available for this item.
August 14, 1997
MICROCIRCUIT, DIGITAL, RADIATION HARDENED, CMOS, 4-BIT MAGNITUDE COMPARATOR, MONOLITHIC SILICON
A description is not available for this item.
April 4, 1997
MICROCIRCUIT, DIGITAL, RADIATION HARDENED, CMOS, 4-BIT MAGNITUDE COMPARATOR, MONOLITHIC SILICON
This appendix establishes minimum requirements for microcircuit die to be supplied under the Qualified Manufacturers List (QML) Program. QML microcircuit die meeting the requirements of MIL-PRF-38535...
SMD-5962-96757
January 19, 1996
MICROCIRCUIT, DIGITAL, RADIATION HARDENED, CMOS, 4-BIT MAGNITUDE COMPARATOR, MONOLITHIC SILICON
A description is not available for this item.