CENELEC - EN 60749-34
Semiconductor devices Mechanical and climatic test methods Part 34: Power Cycling
inactive
| Organization: | CENELEC |
| Publication Date: | 1 April 2004 |
| Status: | inactive |
| Page Count: | 12 |
| ICS Code (Semiconductor devices): | 31.080 |
Document History
December 1, 2010
Semiconductor devices - Mechanical and climatic test methods - Part 34: Power cycling
Scope and object
This part of IEC 60749 describes a test method used to determine the resistance of a semiconductor device to thermal and mechanical stresses due to cycling the power dissipation of...
EN 60749-34
April 1, 2004
Semiconductor devices Mechanical and climatic test methods Part 34: Power Cycling
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