UNLIMITED FREE ACCESS TO THE WORLD'S BEST IDEAS

close
Already an Engineering360 user? Log in.

This is embarrasing...

An error occurred while processing the form. Please try again in a few minutes.

Customize Your Engineering360 Experience

close
Privacy Policy

This is embarrasing...

An error occurred while processing the form. Please try again in a few minutes.

CENELEC - EN 60749-34

Semiconductor devices Mechanical and climatic test methods Part 34: Power Cycling

inactive
Organization: CENELEC
Publication Date: 1 April 2004
Status: inactive
Page Count: 12
ICS Code (Semiconductor devices): 31.080

Document History

December 1, 2010
Semiconductor devices - Mechanical and climatic test methods - Part 34: Power cycling
Scope and object This part of IEC 60749 describes a test method used to determine the resistance of a semiconductor device to thermal and mechanical stresses due to cycling the power dissipation of...
EN 60749-34
April 1, 2004
Semiconductor devices Mechanical and climatic test methods Part 34: Power Cycling
A description is not available for this item.
Advertisement