scope:

This standard establishes uniform criteria for conducting trade studies to determine the optimal design for command, control and communication system and component fault diagnosis/isolation subsystems, hereafter referred to as Fault Identification & Test Subsystems (FITS). FITS include the hardware and/or software necessary for the detection and isolation of failures.

This standard is applicable to Electronics Systems Division procurements which include the development of fault/detection isolation/diagnosis and test subsystems where:

a. Selections can be made among such alternatives as centrally controlled system built-in-test, individual system component (equipment) built-in-test, equipment subunit built-in-test, special purpose external test subsystems and testers or combinations of the preceding.

b. Different design and/or architectures exist for each alternative. Such subsystems are inclusive of system/equipment operational level fault detection coupled with built-in-test, and external test subsystems, as well as shop and depot level applicable built-in-test and testers.