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NPFC - MIL-STD-1309

DEFINITIONS OF TERMS FOR TESTING, MEASUREMENT AND DIAGNOSTICS

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Organization: NPFC
Publication Date: 12 February 1992
Status: active
Page Count: 65
scope:

The purpose of this standard is to standardize the definitions of the most commonly used terms for testing, measurement and diagnostics.

This standard establishes the definitions most commonly used for test, measurement and diagnostics.

intended Use:

This standard contains definitions of key words and terms used in testing, measurement, and diagnostics.

Document History

MIL-STD-1309
February 12, 1992
DEFINITIONS OF TERMS FOR TESTING, MEASUREMENT AND DIAGNOSTICS
The purpose of this standard is to standardize the definitions of the most commonly used terms for testing, measurement and diagnostics. This standard establishes the definitions most commonly used...
MIL-STD-1309
November 18, 1983
DEFINITIONS OF TERMS FOR TESTING, MEASUREMENT AND DIAGNOSTICS
A description is not available for this item.
MIL-STD-1309
May 30, 1975
DEFINITIONS OF TERMS FOR TESTING, MEASUREMENT AND DIAGNOSTICS
A description is not available for this item.
MIL-STD-1309
April 12, 1972
DEFINITIONS OF TERMS FOR TESTING, MEASUREMENT AND DIAGNOSTICS
A description is not available for this item.
MIL-STD-1309
December 20, 1966
DEFINITIONS OF TERMS FOR TESTING, MEASUREMENT AND DIAGNOSTICS
A description is not available for this item.

References

This document references:
IEEE 716 - Standard Test Language for All Systems - Common/Abbreviated Test Language for All Systems (C/ATLAS)
Published by IEEE on March 16, 1995
IEEE Std 716-1995 defines a high order language for testing. This language is designed to describe tests in terms that are independent of any specific test system. It has been constrained to ensure...
This document references:
MIL-PRF-28800 - TEST EQUIPMENT FOR USE WITH ELECTRICAL AND ELECTRONIC EQUIPMENT, GENERAL SPECIFICATION FOR
Published by NPFC on June 24, 1996
This specification covers the general requirements for test equipment (see 6.5.2.14) used in testing and calibrating electrical and electronic equipment. The test equipment may be of commercial...
This document is referenced by:
IEC 61671 - Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML
Published by IEC on June 1, 2012
ATML defines a standard exchange medium for sharing information between components of ATSs. This information includes test data, resource data, diagnostic data, and historic data. The exchange medium...
This document is referenced by:
SECNAV 3960.6 - (OP-461) DEPARTMENT OF THE NAVY POLICY AND RESPONSIBILITY FOR TEST, MEASUREMENT, MONITORING, DIAGNOSTIC EQUIPMENT AND SYSTEMS, AND METEROLOGY AND CALIBRATION (METCAL)
Published by NAVY on October 12, 1990
Applicability: This instruction applies to all components of the Department of the Navy (DON) responsible for (a) design, acquisition, operation, and logistic support of weapons platforms, weapon...
This document is referenced by:
IEEE 1671.2 - Automatic Test Markup Language (ATML) Instrument Description
Published by IEEE on December 5, 2012
This standard defines an exchange format, utilizing extensible markup language (XML), for both the static description of instrument models, and the specific description of instrument instance...
This document is referenced by:
MIL-HDBK-798 - System Engineer's Design for Discard Handbook
Published by NPFC on August 21, 2018
A description is not available for this item.
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