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IEEE 1671.2

Automatic Test Markup Language (ATML) Instrument Description

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Organization: IEEE
Publication Date: 5 December 2012
Status: active
Page Count: 56
scope:

This standard defines an exchange format, utilizing extensible markup language (XML), for both the static description of instrument models, and the specific description of instrument instance information.

Document History

IEEE 1671.2
December 5, 2012
Automatic Test Markup Language (ATML) Instrument Description
This standard defines an exchange format, utilizing extensible markup language (XML), for both the static description of instrument models, and the specific description of instrument instance...
IEEE 1671.2
September 26, 2008
Trial-Use Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML: Exchanging Instrument Descriptions
A description is not available for this item.

References

This document references:
MIL-STD-1309 - DEFINITIONS OF TERMS FOR TESTING, MEASUREMENT AND DIAGNOSTICS
Published by NPFC on February 12, 1992
The purpose of this standard is to standardize the definitions of the most commonly used terms for testing, measurement and diagnostics. This standard establishes the definitions most commonly used...
This document references:
MIL-PRF-55310 - OSCILLATOR, CRYSTAL CONTROLLED, GENERAL SPECIFICATION FOR
Published by NPFC on March 12, 2020
Scope. This specification covers the general requirements for quartz crystal oscillators used in electronic equipment.
This document references:
TIA-232 - Interface Between Data Terminal Equipment and Data Circuit- Terminating Equipment Employing Serial Binary Data Interchange
Published by TIA on October 1, 1997
This standard is applicable to the interconnection of data terminal equipment (DTE) and data circuit-terminating equipment (DCE) employing serial binary data interchange. It defines: Section 2 Signai...
This document references:
IETF RFC 4361 - Node-specific Client Identifiers for Dynamic Host Configuration Protocol Version Four (DHCPv4)
Published by IETF on February 1, 2006
This document specifies the format that is to be used for encoding Dynamic Host Configuration Protocol Version Four (DHCPv4) client identifiers, so that those identifiers will be interchangeable with...
This document references:
IEEE 802.3.1 - Management Information Base (MIB) Definitions for Ethernet
Published by IEEE on June 14, 2013
This standard contains the Management Information Base (MIB) module specifications for IEEE Std 802.3, also known as Ethernet. It includes the Structure of Management Information Version 2 (SMIv2)...
This document is referenced by:
DEF STAN 00-052 - The General Requirements for Product Acceptance and Maintenance Test Specifications and Test Schedules
Published by MODUK on January 14, 2019
The purpose of this document is to define a common standard for test specifications and test schedules produced by contractors supplying materiel for Ministry of Defence use. It should be noted, this...
This document is referenced by:
IEEE 1671 SERIES - Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML
Published by IEEE on September 30, 2010
ATML defines a standard exchange medium for sharing information between components of ATSs. This information includes test data, resource data, diagnostic data, and historic data. The exchange medium...
This document is referenced by:
IEEE 1671.3 - Automatic Test Markup Language (ATML) Unit Under Test (UUT) Description
Published by IEEE on December 6, 2017
This standard defines an exchange format, utilizing Extensible Markup Language (XML), for both the static description of a UUT and the specific description of UUT instance information.
This document is referenced by:
DEF STAN 66-031: PART 08 - Basic Requirements and Tests for Electronic and Electrical Test and Measurement Equipment Part 08: Automatic Test Systems utilising an Open System Architecture
Published by MODUK on August 28, 2021
This Defence Standard defines the general design, manufacture and supply requirements applicable to Electrical and Electronic Test and Measurement Equipment (TME) intended for Service use and...
This document is referenced by:
IEEE 1871.1 - Recommended Practice for Using IEEE 1671.2 Instrument Description Templates for Describing Synthetic Instrumentation for Classes of Instruments such as Waveform Generators, Digitizers, External Oscillators, and Up and Down Converters
Published by IEEE on December 10, 2014
This recommended practice provides Instrument Description templates, compliant with IEEE 1671.2, that providers of synthetic instruments should use to describe waveform generators, digitizers,...
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