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IEEE 1671.2

Automatic Test Markup Language (ATML) Instrument Description

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Organization: IEEE
Publication Date: 5 December 2012
Status: active
Page Count: 56
scope:

This standard defines an exchange format, utilizing extensible markup language (XML), for both the static description of instrument models, and the specific description of instrument instance information.

Document History

IEEE 1671.2
December 5, 2012
Automatic Test Markup Language (ATML) Instrument Description
This standard defines an exchange format, utilizing extensible markup language (XML), for both the static description of instrument models, and the specific description of instrument instance...
IEEE 1671.2
September 26, 2008
Trial-Use Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML: Exchanging Instrument Descriptions
A description is not available for this item.

References

This document references:
IEEE 1014 - Standard for a Versatile Backplane Bus: VMEbus
Published by IEEE on March 12, 1987
Abstract This IEEE 1014 standard specifies a high-performance backplane bus for use in microcomputer systems that employ single or multiple microprocessors. It is based on the VMEbus specification,...
This document references:
IEEE 1057 - Digitizing Waveform Recorders
Published by IEEE on September 28, 2017
This standard defines specifications and describes test methods for measuring the performance of electronic digitizing waveform recorders, waveform analyzers, and digitizing oscilloscopes with...
This document references:
IEEE 1155 - Standard for VMA Extensions for Instrumentation: VXIbus
Published by IEEE on September 17, 1992
A technically sound modular instrument standard based on IEEE Std 1014-1987, which is open to all manufacturers and is compatible with present industry standards, is defined. The VXIbus specification...
This document references:
IEEE 1394.1 - High Performance Serial Bus Bridges
Published by IEEE on December 8, 2004
This is a full-use standard whose scope is to extend the already defined asynchronous and isochronous services of High Performance Serial Bus beyond the local bus by means of a device, the bridge,...
This document references:
IEEE 1641 - Signal and Test Definition
Published by IEEE on June 1, 2012
This standard provides the means to define and describe signals used in testing. It provides a set of common basic signal definitions, built upon formal mathematical specifications, so that signals...
This document is referenced by:
IEEE 1641.1 - Guide for the Use of Signal and Test Definition-Amendment 1: Addition of Guidelines for Producing Reusable Test Signal Frameworks for Use on Platforms Utilizing Automatic Test Markup Language
Published by IEEE on March 8, 2018
Amend the guide to add guidelines for producing reusable TSFs for use on platforms utilizing ATML, and produce example TSFs showing conformance with the guidelines. This guide explains how signal...
This document is referenced by:
BS IEC 61671 - IEEE standard for automatic test markup language (ATML) for exchanging automatic test equipment and test information via XML
Published by BSI on August 31, 2012
A description is not available for this item.
This document is referenced by:
IEEE 1871.1 - Recommended Practice for Using IEEE 1671.2 Instrument Description Templates for Describing Synthetic Instrumentation for Classes of Instruments such as Waveform Generators, Digitizers, External Oscillators, and Up and Down Converters
Published by IEEE on December 10, 2014
This recommended practice provides Instrument Description templates, compliant with IEEE 1671.2, that providers of synthetic instruments should use to describe waveform generators, digitizers,...
This document is referenced by:
DEF STAN 66-031: PART 8 - Requirements for Electronic and Electrical Test and Measurement Equipment Part 8: Requirements for Automatic Test Systems utilising an Open System Architecture
Published by MODUK on September 19, 2016
This Defence Standard defines the general design, manufacture and supply requirements applicable to Electrical and Electronic Test and Measurement Equipment (TME) intended for Service use, and...
This document is referenced by:
IEEE 1671.3 - Automatic Test Markup Language (ATML) Unit Under Test (UUT) Description
Published by IEEE on December 6, 2017
This standard defines an exchange format, utilizing Extensible Markup Language (XML), for both the static description of a UUT and the specific description of UUT instance information.
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