BSI - BS EN 60749-4
Semiconductor Devices - Mechanical and Climatic Test Methods - Part 4: Damp Heat, Steady State, Highly Accelerated Stress Test (HAST)
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| Organization: | BSI |
| Publication Date: | 10 September 2002 |
| Status: | inactive |
| Page Count: | 12 |
| ICS Code (Semiconductor devices in general): | 31.080.01 |
Document History
November 30, 2017
Semiconductor devices - Mechanical and climatic test methods Part 4: Damp heat, steady state, highly accelerated stress test (HAST)
A description is not available for this item.
BS EN 60749-4
September 10, 2002
Semiconductor Devices - Mechanical and Climatic Test Methods - Part 4: Damp Heat, Steady State, Highly Accelerated Stress Test (HAST)
A description is not available for this item.
References
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