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BSI - BS EN IEC 60749-30

Semiconductor devices — Mechanical and climatic test methods Part 30: Preconditioning of non-hermetic surface mount devices prior to reliability testing

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Organization: BSI
Publication Date: 30 September 2020
Status: active
Page Count: 18
ICS Code (Semiconductor devices in general): 31.080.01

Document History

BS EN IEC 60749-30
September 30, 2020
Semiconductor devices — Mechanical and climatic test methods Part 30: Preconditioning of non-hermetic surface mount devices prior to reliability testing
A description is not available for this item.
January 27, 2006
Semiconductor devices - Mechanical and climatic test methods - Part 30: Preconditioning of non-hermetic surface mount devices prior to reliability testing
A description is not available for this item.
January 27, 2006
Semiconductor devices - Mechanical and climatic test methods Part 30: Preconditioning of nonhermetic surface mount devices prior to reliability testing
A description is not available for this item.

References

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