CENELEC - EN 60749-11
Semiconductor Devices Mechanical and Climatic Test Methods Part 11: Rapid Change of Temperature Two-Fluid-Bath Method
active, Most Current
Organization: | CENELEC |
Publication Date: | 1 August 2002 |
Status: | active |
Page Count: | 12 |
ICS Code (Semiconductor devices in general): | 31.080.01 |
Document History
EN 60749-11
August 1, 2002
Semiconductor Devices Mechanical and Climatic Test Methods Part 11: Rapid Change of Temperature Two-Fluid-Bath Method
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