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CENELEC - EN 60749-11

Semiconductor Devices Mechanical and Climatic Test Methods Part 11: Rapid Change of Temperature Two-Fluid-Bath Method

active, Most Current
Organization: CENELEC
Publication Date: 1 August 2002
Status: active
Page Count: 12
ICS Code (Semiconductor devices in general): 31.080.01

Document History

EN 60749-11
August 1, 2002
Semiconductor Devices Mechanical and Climatic Test Methods Part 11: Rapid Change of Temperature Two-Fluid-Bath Method
A description is not available for this item.

References

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