CENELEC - EN 60749-33
Semiconductor devices Mechanical and climatic test methods Part 33: Accelerated moisture resistance Unbiased autoclave
active, Most Current
| Organization: | CENELEC |
| Publication Date: | 1 April 2004 |
| Status: | active |
| Page Count: | 10 |
| ICS Code (Semiconductor devices): | 31.080 |
Document History
EN 60749-33
April 1, 2004
Semiconductor devices Mechanical and climatic test methods Part 33: Accelerated moisture resistance Unbiased autoclave
A description is not available for this item.