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BSI - BS EN 60749-24

Semiconductor devices Mechanical and climatic test methods Part 24: Accelerated moisture resistance Unbiased HAST

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Organization: BSI
Publication Date: 24 June 2004
Status: active
Page Count: 10
ICS Code (Semiconductor devices in general): 31.080.01

Document History

BS EN 60749-24
June 24, 2004
Semiconductor devices Mechanical and climatic test methods Part 24: Accelerated moisture resistance Unbiased HAST
A description is not available for this item.

References

This document references:
IEC 60749-33 - Semiconductor devices - Mechanical and climatic test methods - Part 33: Accelerated moisture resistance - Unbiased autoclave
Published by IEC on March 1, 2004
Scope and object The unbiased autoclave test is performed to evaluate the moisture resistance integrity of nonhermetic packaged solid-state devices using moisture condensing or moisture saturated...
This document references:
IEC 60749-5 - Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady-state temperature humidity bias life test
Published by IEC on April 1, 2017
This part of IEC 60749 provides a steady-state temperature and humidity bias life test for the purpose of evaluating the reliability of non-hermetic packaged solid-state devices in humid...
This document references:
EN IEC 60749-5 - Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady-state temperature humidity bias life test
Published by CENELEC on January 1, 2024
This part of IEC 60749 provides a steady-state temperature and humidity bias life test to evaluate the reliability of non-hermetic packaged semiconductor devices in humid environments. This test...
This document references:
EN 60749-33 - Semiconductor devices Mechanical and climatic test methods Part 33: Accelerated moisture resistance Unbiased autoclave
Published by CENELEC on April 1, 2004
A description is not available for this item.
This document is referenced by:
BS EN IEC 60749-30 - Semiconductor devices — Mechanical and climatic test methods Part 30: Preconditioning of non-hermetic surface mount devices prior to reliability testing
Published by BSI on September 30, 2020
A description is not available for this item.
This document is referenced by:
BS EN 60749-33 - Semiconductor devices Mechanical and climatic test methods Part 33: Accelerated moisture resistance Unbiased autoclave
Published by BSI on June 22, 2004
A description is not available for this item.
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