UNLIMITED FREE
ACCESS
TO THE WORLD'S BEST IDEAS

SUBMIT
Already a GlobalSpec user? Log in.

This is embarrasing...

An error occurred while processing the form. Please try again in a few minutes.

Customize Your GlobalSpec Experience

Finish!
Privacy Policy

This is embarrasing...

An error occurred while processing the form. Please try again in a few minutes.

DLA - SMD-5962-90984

MICROCIRCUIT, DIGITAL, HIGH-SPEED CMOS, DUAL DECADE RIPPLE COUNTER, TTL COMPATIBLE INPUTS, MONOLITHIC SILICON

inactive
Organization: DLA
Publication Date: 8 March 1993
Status: inactive
Page Count: 17
scope:

This drawing forms a part of a one part - one part number documentation system (see 6.6 herein). Two product assurance classes consisting of military high reliability (device classes B, Q, and M) and space application (device classes S and V), and a choice of case outlines and lead finishes are available and are reflected in the Part or Identifying Number (PIN). Device class M microcircuits represent non-JAN class B microcircuits in accordance with 1.2.1 of MIL-STD-883, "Provisions for the use of MIL-STD-883 in conjunction with compliant non-JAN devices". When available, a choice of Radiation Hardness Assurance (RHA) levels are reflected in the PIN.

The PIN shall be as shown in the following example:

Device classes M, B, and S RHA marked devices shall meet the MIL-M-38510 specified RHA levels and shall be marked with the appropriate RHA designator. Device classes Q and V RHA marked devices shall meet the MIL-M-38535 specified RHA levels and shall be marked with the appropriate RHA designator. A dash (-) indicates a non-RHA device.

The device type(s) shall identify the circuit function as follows:

Device type Generic number Circuit function 01 54HCT390 Dual decade ripple counter, TTL compatible inputs

The device class designator shall be a single letter identifying the product assurance level as follows:

Device class Device requirements documentation M Vendor self-certification to the requirements for non-JAN class B microcircuits in accordance with 1.2.1 of MIL-STD-883 B or S Certification and qualification to MIL-M-38510 Q or V Certification and qualification to MIL-I-38535

The case outline(s) shall be as designated in MIL-STD-1835 and as follows:

Outline letter Descriptive designator Terminals Package style E GDIP1-T16 or CDIP2-T16 16 Dual-in-line

The lead finish shall be as specified in MIL-M-38510 for classes M, B, and S or MIL-I-38535 for classes Q and V. Finish letter "X" shall not be marked on the microcircuit or its packaging. The "X" designation is for use in specifications when lead finishes A, B, and C are considered acceptable and interchangeable without preference.

Supply voltage range (VCC) - - - - - - - - - - - - - - - - - - - - - - −0.5 V dc to +7.0 V dc DC input voltage (VIN) - - - - - - - - - - - - - - - - - - - - - - - - −0.5 V dc to VCC +0.5 V dc DC output voltage (VOUT) - - - - - - - - - - - - - - - - - - - - - - - −0.5 V dc to VCC +0.5 V dc Input clamp current (IIK) (VIN < −0.5 V dc, VIN > VCC +0.5 V dc) - - - ±20mA Output clamp current (IOK) (VOUT < −0.5 V dc, VOUT > VCC +0.5 V dc)- - ±20mA DC drain current (I0) (per output) (−0.5 V < VOUT < VCC +0.5 V dc) - - ±25mA DC VCC or ground current (ICC or IGND) - - - - - - - - - - - - - - - - ±50mA Storage temperature range - - - - - - - - - - - - - - - - - - - - - - −65°C to +150°C Maximum power dissipation (PD) - - - - - - - - - - - - - - - - - - - - 500mW 4/ Lead temperature (soldering, 10 seconds) - - - - - - - - - - - - - - - +265°C Thermal resistance, junction-to-case (θJC) - - - - - - - - - - - - - - See MIL-STD-1835 Junction temperature (TJ) - - - - - - - - - - - - - - - - - - - - - - +175°C

Supply voltage (VCC) - - - - - - - - - - - - - - - - - - - - - - - - - - +4.5 V dc to +5.5 V dc Input voltage range (VIN) - - - - - - - - - - - - - - - - - - - - - - - 0.0 V dc to VCC Output voltage range (VOUT) - - - - - - - - - - - - - - - - - - - - - - 0.0 V dc to VCC Minimum high level input voltage (VIH) - - - - - - - - - - - - - - - - - 2.0 V dc Maximum low level input voltage (VIL) - - - - - - - - - - - - - - - - - 0.8 V dc Case operating temperature range (TC) - - - - - - - - - - - - - - - - - −55°C to +125°C Input rise or fall (tr, tf) time: (O.1VCC to O.9VCC: 0.9VCC to 0.1VCC) - - - - - - - - - - - - - - - - 0 to 500 ns Maximum high level output current (IOH) - - - - - - - - - - - - - - - - −4.0 mA Maximum low level output current (IOL) - - - - - - - - - - - - - - - - - +4.0 mA

Fault coverage measurement of manufacturing logic tests (MIL-STD-883. test method 5012) - - - - - - - - - - - - - - XX percent 5/

intended Use:

Microcircuits conforming to this drawing are intended for use for Government microcircuit applications (original equipment), design applications, and logistics purposes.

Microcircuits... View More

Document History

February 1, 2021
MICROCIRCUIT, DIGITAL, HIGH-SPEED CMOS, DUAL DECADE RIPPLE COUNTER, TTL COMPATIBLE INPUTS, MONOLITHIC SILICON
Scope. This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class V). A choice of case outlines and lead...
March 25, 2014
MICROCIRCUIT, DIGITAL, HIGH-SPEED CMOS, DUAL DECADE RIPPLE COUNTER, TTL COMPATIBLE INPUTS, MONOLITHIC SILICON
This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class V). A choice of case outlines and lead finishes...
December 21, 2006
MICROCIRCUIT, DIGITAL, HIGH-SPEED CMOS, DUAL DECADE RIPPLE COUNTER, TTL COMPATIBLE INPUTS, MONOLITHIC SILICON
This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class V). A choice of case outlines and lead finishes...
SMD-5962-90984
March 8, 1993
MICROCIRCUIT, DIGITAL, HIGH-SPEED CMOS, DUAL DECADE RIPPLE COUNTER, TTL COMPATIBLE INPUTS, MONOLITHIC SILICON
This drawing forms a part of a one part - one part number documentation system (see 6.6 herein). Two product assurance classes consisting of military high reliability (device classes B, Q, and M) and...

References

Advertisement