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IEC 60749-34

Semiconductor devices - Mechanical and climatic test methods - Part 34: Power cycling

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Organization: IEC
Publication Date: 1 March 2004
Status: inactive
Page Count: 30
ICS Code (Semiconductor devices): 31.080

Document History

October 1, 2010
Semiconductor devices – Mechanical and climatic test methods – Part 34: Power cycling
Scope and object This part of IEC 60749 describes a test method used to determine the resistance of a semiconductor device to thermal and mechanical stresses due to cycling the power dissipation of...
IEC 60749-34
March 1, 2004
Semiconductor devices - Mechanical and climatic test methods - Part 34: Power cycling
A description is not available for this item.

References

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