IEC 60749-34
Semiconductor devices - Mechanical and climatic test methods - Part 34: Power cycling
inactive
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| Organization: | IEC |
| Publication Date: | 1 March 2004 |
| Status: | inactive |
| Page Count: | 30 |
| ICS Code (Semiconductor devices): | 31.080 |
Document History
October 1, 2010
Semiconductor devices – Mechanical and climatic test methods – Part 34: Power cycling
Scope and object
This part of IEC 60749 describes a test method used to determine the resistance of a semiconductor device to thermal and mechanical stresses due to cycling the power dissipation of...
IEC 60749-34
March 1, 2004
Semiconductor devices - Mechanical and climatic test methods - Part 34: Power cycling
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