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DLA - SMD-5962-92333 REV A

MICROCIRCUIT, DIGITAL, CMOS, 8-BIT EPROM MICROCONTROLLER WITH 10 BIT A/D, CAPTIVE/COMPARE TIMER, MONOLITHIC SILICON

inactive
Organization: DLA
Publication Date: 5 July 1996
Status: inactive
Page Count: 28
scope:

This drawing forms a part of a one part - one part number documentation system (see 6.6 herein). Three product assurance classes consisting of space application (device class V), military high reliability (device classes M and Q), and non-traditional military (device class N) with a choice of case outlines and lead finishes are available and are reflected in the Part or Identifying Number (PIN). Device class M microcircuits represent non-JAN class B microcircuits in accordance with 1.2.1 of MIL-STD-883, "Provisions for the use of MIL-STD-883 in conjunction with compliant non-JAN devices". For device class N, the user is cautioned to assure that the device is appropriate for the application environment. When available, a choice of Radiation Hardness Assurance (RHA) levels are reflected in the PIN.

The PIN shall be as shown in the following example:

Device class M RHA marked devices shall meet the MIL-I-38535 appendix A specified RHA levels and shall be marked with the appropriate RHA designator. Device classes N, Q, and V RHA marked devices shall meet the MIL-I-38535 specified RHA levels and shall be marked with the appropriate RHA designator. A dash (-) indicates a non-RHA device.

The device type(s) shall identify the circuit function as follows:

Device type Generic number Circuit function 01 1/ 87C552 CMOS 8-bit EPROM microcontroller with 10 Bit A/D, captive/compare timer, high speed outputs, and PWM 02 2/ 87C552 CMOS 8-bit EPROM microcontroller with 10 Bit A/D, captive/compare timer, high speed outputs, and PWM, One time programmable. 03 1/ 87C552 CMOS 8-bit EPROM microcontroller with 10 Bit A/D, captive/compare timer, high speed outputs, and PWM 04 2/ 87C552 CMOS 8-bit EPROM microcontroller with 10 Bit A/D, captive/compare timer, high speed outputs, and PWM, One time programmable.

The device class designator shall be a single letter identifying the product assurance level as follows:

Device class Device requirements documentation M Vendor self-certification to the requirements for non-JAN class B microcircuits in accordance with 1.2.1 of MIL-STD-883 N Certification and qualification to MIL-I-38535 with a non-traditional performance environment 3/ Q or V Certification and qualification to MIL-I-38535

The case outline(s) shall be as designated in MIL-STD-1835 and as follows:

Outline letter Descriptive designator Terminals Package style M GQCC1-J68 68 Ceramic leaded chip carrier Y See figure 1 68 Plastic leaded chip carrier

The lead finish shall be as specified in MIL-STD-883 (see 3.1 herein) for class M or MIL-I-38535 for classes N, Q, and V. Finish letter "X" shall not be marked on the microcircuit or its packaging. The "X" designation is for use in specifications when lead finishes A, B, and C are considered acceptable and interchangeable without preference.

Voltage on any pin to Vss........................... −0.5 to 6.5 V Voltage on [E bar][A bar]/VPP .................................. −0.5 to 13 V Storage temperature range........................... −65°C to +150°C Maximum power dissipation........................... 1 W Lead temperature (soldering 5 seconds).............. +300°C Thermal resistance, junction to case (ΘJC) Case outline M ................................... See MIL-STD-1835 Case outline Y ................................... 15°C/W

Supply voltage (VCC)................................... 4.5 V to 5.5 V Maximum low level input voltage (except [E bar][A bar], P1.6/SCL, P1.7/SDA)........................ 0.2 VDD −0.25 V [E bar][A bar] ................................................... 0.2 VDD −0.45 V (P1.6/SCL, P1.7/SDA) 5/ .............................. 0.3 VDD Minimum high level input voltage (except XTAL1, RST, P1.6/SCL, P1.7/SDA)................ 0.2 VDD + 0.1 V (XTAL1, RST)........................................... 0.7 VDD + 0.2 V (P1.6/SCL, P1.7/SDA)................................... 0.7 VDD Case operating temperature range (TC): Device types 01,02 .................................. −55°C to +125°C Device types 03 ..................................... −40°C to +85°C Device types 04 ..................................... −40°C to +125°C Oscillator frequency................................... 3.5 MHz to 12 MHz

Fault coverage measurement of manufacturing logic tests (MIL-STD-883, test method 5012) . . . . . . XX percent 6/

intended Use:

Microcircuits conforming to this drawing are intended for use for Government microcircuit applications (original equipment), design applications, and logistics purposes.

Microcircuits... View More

Document History

June 14, 2006
MICROCIRCUIT, DIGITAL, CMOS, 8-BIT EPROM MICROCONTROLLER WITH 10 BIT A/D, CAPTIVE/COMPARE TIMER, MONOLITHIC SILICON
This drawing documents three product assurance class levels consisting of high reliability (device classes Q and M), space application (device class V), and nontraditional performance environment...
September 5, 1996
MICROCIRCUIT, DIGITAL, CMOS, 8-BIT EPROM MICROCONTROLLER WITH 10 BIT A/D, CAPTIVE/COMPARE TIMER, MONOLITHIC SILICON
A description is not available for this item.
SMD-5962-92333 REV A
July 5, 1996
MICROCIRCUIT, DIGITAL, CMOS, 8-BIT EPROM MICROCONTROLLER WITH 10 BIT A/D, CAPTIVE/COMPARE TIMER, MONOLITHIC SILICON
This drawing forms a part of a one part - one part number documentation system (see 6.6 herein). Three product assurance classes consisting of space application (device class V), military high...
November 2, 1992
MICROCIRCUIT, DIGITAL, CMOS, 8-BIT EPROM MICROCONTROLLER WITH 10 BIT A/D, CAPTIVE/COMPARE TIMER, MONOLITHIC SILICON
This drawing forms a part of a one part - one part number documentation system (see 6.6 herein). Two product assurance classes consisting of military high reliability (device classes B, Q, and M) and...

References

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