scope:

This drawing forms part of a one part - one part number documentation system (see 6.6 herein). Two product assurance classes consisting of military high reliability (device classes B, Q, and M) and space application (device classes S and V), and a choice of case outlines and lead finishes are available and are reflected in the Part or identifying Number (PIN). Device class M microcircuits represent non-JAN class B microcircuits in accordance with 1.2.1 of MIL-STD-883, "Provisions for the use of MIL-STD-883 in conjunction with compliant non-JAN devices". When available, a choice of radiation hardness assurance (RHA) levels are reflected in the PIN.

The PIN shall be as shown in the following example:

Device classes M, B, and S RHA marked devices shall meet the MIL-M-38510 specified RHA levels and shall be marked with the appropriate RHA designator. Device classes Q and V RHA marked device shall meet the MIL-I-38535 specified RHA levels and shall be marked with the appropriate RHA designator. A dash (-) indicates a non-RHA device.

The device type(s) shall identify the circuit function as follows:

Device type Generic number Circuit function Access time 01 7C132 2K × 8 Dual port SRAM, MASTER 55 ns 02 7C132 2K × 8 Dual port SRAM, MASTER 45 ns 03 7C132 2K × 8 Dual port SRAM, MASTER 35 ns 04 7C142 2K × 8 Dual port SRAM, SLAVE 55 ns 05 7C142 2K × 8 Dual port SRAM, SLAVE 45 ns 06 7C142 2K × 8 Dual port SRAM, SLAVE 35 ns 07 7C136 2K × 8 Dual port SRAM, MASTER 55 ns 08 7C136 2K × 8 Dual port SRAM, MASTER 45 ns 09 7C136 2K × 8 Dual port SRAM, MASTER 35 ns 10 7C146 2K × 8 Dual port SRAM, SLAVE 55 ns 11 7C146 2K × 8 Dual port SRAM, SLAVE 45 ns 12 7C146 2K × 8 Dual port SRAM, SLAVE 35 ns

The device class designator shall be a single letter identifying the product assurance level (see 6.7 herein) as follows:

Device class Device requirements documentation M Vendor self-certification to the requirements for non-JAN class B microcircuits in accordance with 1.2.1 of MIL-STD-883 B or S Certification and qualification to MIL-M-38510 Q or V Certification and qualification to MIL-I-38535

The case outlines shall be as designated in MIL-STD-1835 and as follows:

Outline letter Descriptive designator Terminals Package style X CQCC1-N52 52 Square leadless chip carrier Y GDIP1-T48 or CDIP2-T48 48 Dual-in-line Z See figure 1 48 Square leadless chip carrier U See figure 1 48 Flat pack.

The lead finish shall be as specified in MIL-M-38510 for classes M, B, and S or MIL-I-38535 for classes Q and V. Finish letter "X" shall not be marked on the microcircuit or its packaging. The "X" designation is for use in specifications when lead finishes A, B, and C are considered acceptable and interchangeable without preference.

Supply voltage range (V_CC) - - - - - - - - - - - - - - - - - - - - −0.5 V dc to +7.0 V dc DC voltage range applied to outputs in high Z state - - - - - - - −0.5 V dc to +7.0 V dc DC Input voltage range - - - - - - - - - - - - - - - - - - - - - - −3.0 V dc to +7.0 V dc DC output current - - - - - - - - - - - - - - - - - - - - - - - - 20 mA Maximum power dissipation 1/ - - - - - - - - - - - - - - - - - - 1.0 W Lead temperature (soldering, 10 seconds) - - - - - - - - - - - - - +260°C Thermal resistance, junction-to-case (θ_JC): Cases X and Y - - - - - - - - - - - - - - - - - - - - - - - - - See MIL-STD-1835 Cases Z and U - - - - - - - - - - - - - - - - - - - - - - - - - 10°C/W 2/ Junction temperature (T_J) - - - - - - - - - - - - - - - - - - - - +175°C Storage temperature range - - - - - - - - - - - - - - - - - - - - −65°C to +150°C Temperature under bias range - - - - - - - - - - - - - - - - - - - −55°C to +125°C

Supply voltage range (V_CC) - - - - - - - - - - - - - - - - - - - - +4.5 V dc to +5.5 V dc Ground voltage (GND) - - - - - - - - - - - - - - - - - - - - - - - 0 V dc Input high voltage range (V_IH) - - - - - - - - - - - - - - - - - - 2.2 V dc to V_CC +0.5 V dc Input Low voltage range (V_IL) 3/- - - - - - - - - - - - - - - - - −0.5 V dc to 0.8 V dc Case operating temperature range (T_C) - - - - - - - - - - - - - - −55°C to +125°C

Fault coverage measurement of manufacturing logic tests (MIL-STD-883, test method 5012) - - - - - - - - - - 4/ percent

intended Use: