BSI - BS CECC 50000
Harmonized system of quality assessment for electronic components - Generic specification: Discrete semiconductor devices
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| Organization: | BSI |
| Publication Date: | 30 October 1987 |
| Status: | active |
| Page Count: | 96 |
| ICS Code (Other semiconductor devices): | 31.080.99 |
scope:
Applies to diodes, transistors, rectifier diodes and thyristors. Specifies quality assessment and test and measurement conditions. Appendices on structural similarity, inspection requirements, tests and screening.
Document History
BS CECC 50000
October 30, 1987
Harmonized system of quality assessment for electronic components - Generic specification: Discrete semiconductor devices
Applies to diodes, transistors, rectifier diodes and thyristors. Specifies quality assessment and test and measurement conditions. Appendices on structural similarity, inspection requirements, tests...
October 30, 1987
Harmonized System of Quality Assessment for Electronic Components Generic Specification: Discrete Semiconductor Devices
A description is not available for this item.
May 31, 1983
Harmonized System of Quality Assessment for Electronic Components Generic Specification: Discrete Semiconductor Devices Supplement No. 1: CECC Assessed Process Average
Specifies procedures to be used for a trial of the CECC assessed process average production of non-operative semiconductor devices.
July 31, 1981
Harmonized system of quality assessment for electronic components. Generic specification: discrete semiconductor devices
Gives general information and specifies the quality assessment procedures, test and measurement requirements for these devices.
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