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BSI - BS CECC 50000

Harmonized System of Quality Assessment for Electronic Components Generic Specification: Discrete Semiconductor Devices Supplement No. 1: CECC Assessed Process Average

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Organization: BSI
Publication Date: 31 May 1983
Status: active
Page Count: 12
ICS Code (Other semiconductor devices): 31.080.99
scope:

Specifies procedures to be used for a trial of the CECC assessed process average production of non-operative semiconductor devices.

Document History

October 30, 1987
Harmonized system of quality assessment for electronic components - Generic specification: Discrete semiconductor devices
Applies to diodes, transistors, rectifier diodes and thyristors. Specifies quality assessment and test and measurement conditions. Appendices on structural similarity, inspection requirements, tests...
October 30, 1987
Harmonized System of Quality Assessment for Electronic Components Generic Specification: Discrete Semiconductor Devices
A description is not available for this item.
BS CECC 50000
May 31, 1983
Harmonized System of Quality Assessment for Electronic Components Generic Specification: Discrete Semiconductor Devices Supplement No. 1: CECC Assessed Process Average
Specifies procedures to be used for a trial of the CECC assessed process average production of non-operative semiconductor devices.
July 31, 1981
Harmonized system of quality assessment for electronic components. Generic specification: discrete semiconductor devices
Gives general information and specifies the quality assessment procedures, test and measurement requirements for these devices.
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