IEEE 301
STANDARD TEST PROCEDURES FOR AMPLIFIERS AND PREAMPLIFIERS FOR SEMICONDUCTOR RADIATION DETECTORS FOR IONIZING RADIATION (R 1982)
inactive
Buy Now
| Organization: | IEEE |
| Publication Date: | 30 January 1976 |
| Status: | inactive |
| Page Count: | 28 |
Document History
October 20, 1988
Standard Test Procedures for Amplifiers and Preamplifiers Used with Detectors of Ionizing Radiation
Foreword
This standard describes test procedures for amplifiers and preamplifiers that are used with semiconductor, scintillation, and proportional detectors in the spectrometry of ionizing...
October 20, 1988
Standard Test Procedures for Amplifiers and Preamplifiers Used with Detectors of Ionizing Radiation
A description is not available for this item.
IEEE 301
January 30, 1976
STANDARD TEST PROCEDURES FOR AMPLIFIERS AND PREAMPLIFIERS FOR SEMICONDUCTOR RADIATION DETECTORS FOR IONIZING RADIATION (R 1982)
A description is not available for this item.
February 19, 1969
Test Procedure for Amplifiers and Preamplifiers for Semiconductor Radiation Detectors (For Ionizing Radiation)
FOREWORD
Semiconductor radiation detectors have come into widespread use in recent years for detection of ionizing radiation. Both silicon and germanium detectors have been developed with silicon...