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IEEE 301

Test Procedure for Amplifiers and Preamplifiers for Semiconductor Radiation Detectors (For Ionizing Radiation)

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Organization: IEEE
Publication Date: 19 February 1969
Status: inactive
Page Count: 21
scope:

FOREWORD

Semiconductor radiation detectors have come into widespread use in recent years for detection of ionizing radiation. Both silicon and germanium detectors have been developed with silicon finding its principal application in the detection and analysis of heavy charged particles. Germanium detectors with their relatively high atomic number (as compared with silicon) and with large sensitive volumes have come into widespread use in the detection and analysis of gamma radiation. The advent of semiconductor detectors has stimulated development of electronic instruments with characteristics that permit exploitation of their capabilities. This has made desirable standard test procedures so that measurements may have the same meaning to all manufacturers and users.

This Test Procedure is not intended to imply that all tests described herein are mandatory, but only that such tests as are carried out should be performed in accordance with the procedures herein.

A companion document is "Test Procedure for Semiconductor Radiation Detectors," IEEE Standards Publication No. 300.

The Institute wishes to acknowledge its indebtedness to those who have so freely given of their time and knowledge, and have conducted experimental work on which many of the IEEE publications are based.

This publication was prepared by the Radiation Detectors Committee of the IEEE Nuclear Science Group. The membership of the Committee was:

Document History

October 20, 1988
Standard Test Procedures for Amplifiers and Preamplifiers Used with Detectors of Ionizing Radiation
Foreword This standard describes test procedures for amplifiers and preamplifiers that are used with semiconductor, scintillation, and proportional detectors in the spectrometry of ionizing...
October 20, 1988
Standard Test Procedures for Amplifiers and Preamplifiers Used with Detectors of Ionizing Radiation
A description is not available for this item.
January 30, 1976
STANDARD TEST PROCEDURES FOR AMPLIFIERS AND PREAMPLIFIERS FOR SEMICONDUCTOR RADIATION DETECTORS FOR IONIZING RADIATION (R 1982)
A description is not available for this item.
IEEE 301
February 19, 1969
Test Procedure for Amplifiers and Preamplifiers for Semiconductor Radiation Detectors (For Ionizing Radiation)
FOREWORD Semiconductor radiation detectors have come into widespread use in recent years for detection of ionizing radiation. Both silicon and germanium detectors have been developed with silicon...

References

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