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IEEE 300

Standard Test Procedures for Semiconductor Charged-Particle Detectors

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Organization: IEEE
Publication Date: 9 June 1988
Status: active
Page Count: 35

Document History

June 9, 1988
Standard Test Procedures for Semiconductor Charged-Particle Detectors
Foreword  This standard provides standard test procedures for semiconductor charged-particle detectors for ionizing radiation. It supersedes the previous edition, ANSI/IEEE Std 300-1982. The standard...
IEEE 300
June 9, 1988
Standard Test Procedures for Semiconductor Charged-Particle Detectors
A description is not available for this item.
November 10, 1982
STANDARD TEST PROCEDURES FOR SEMICONDUCTOR CHARGED-PARTICLE DETECTORS
A description is not available for this item.
January 1, 1969
Test Procedure for SEMICONDUCTOR RADIATION DETECTORS (FOR IONIZING RADIATION)
GENERAL The definition of a semiconductor radiation detector herein will be: A semiconductor device that utilizes the production and motion of excess free charge carriers for the detection and...
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