IEEE 300
STANDARD TEST PROCEDURES FOR SEMICONDUCTOR CHARGED-PARTICLE DETECTORS
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| Organization: | IEEE |
| Publication Date: | 10 November 1982 |
| Status: | inactive |
| Page Count: | 30 |
Document History
June 9, 1988
Standard Test Procedures for Semiconductor Charged-Particle Detectors
Foreword
This standard provides standard test procedures for semiconductor charged-particle detectors for ionizing radiation. It supersedes the previous edition, ANSI/IEEE Std 300-1982. The standard...
June 9, 1988
Standard Test Procedures for Semiconductor Charged-Particle Detectors
A description is not available for this item.
IEEE 300
November 10, 1982
STANDARD TEST PROCEDURES FOR SEMICONDUCTOR CHARGED-PARTICLE DETECTORS
A description is not available for this item.
January 1, 1969
Test Procedure for SEMICONDUCTOR RADIATION DETECTORS (FOR IONIZING RADIATION)
GENERAL
The definition of a semiconductor radiation detector herein will be: A semiconductor device that utilizes the production and motion of excess free charge carriers for the detection and...