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NPFC - MIL-N-63400

NETWORKS, CAPACITOR-RESISTOR

inactive
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Organization: NPFC
Publication Date: 19 December 1983
Status: inactive
Page Count: 4

Document History

MIL-N-63400
December 3, 2013
Networks Capacitor-Resistor
A description is not available for this item.
MIL-N-63400
August 15, 1997
NETWORKS, CAPACITOR-RESISTOR
A description is not available for this item.
MIL-N-63400
August 5, 1988
NETWORKS, CAPACITOR-RESISTOR
A description is not available for this item.
MIL-N-63400
December 19, 1983
NETWORKS, CAPACITOR-RESISTOR
A description is not available for this item.
MIL-N-63400
October 19, 1981
NETWORKS, CAPACITOR-RESISTOR
A description is not available for this item.

References

This document references:
MIL-DTL-39032 - RESISTORS, PACKAGING OF
Published by NPFC on July 13, 2018
This specification covers the requirements for the preservation, packing, and container marking of all types of resistors and associated accessories which are primarily Federal Supply Class (FSC)...
This document references:
MIL-PRF-83401 - RESISTOR NETWORK, FIXED, FILM AND CAPACITOR-RESISTOR NETWORK, CERAMIC CAPACITOR AND FIXED, FILM, RESISTOR, GENERAL SPECIFICATION FOR
Published by NPFC on May 4, 2017
This specification covers the general requirements for hermetically sealed (see 3.10) and nonhermetically sealed (see 3.10.1) networks. These networks consist entirely of fixed, film resistors, or...
This document references:
MIL-STD-1285 - MARKING OF ELECTRICAL AND ELECTRONIC PARTS
Published by NPFC on July 8, 2019
Scope. This standard establishes requirements for the physical marking of electrical and electronic parts. This standard should be implemented by incorporating suitable requirements directly in...
This document references:
MIL-STD-202 - TEST METHOD STANDARD ELECTRONIC AND ELECTRICAL COMPONENT PARTS
Published by NPFC on February 6, 1956
A description is not available for this item.
This document references:
MIL-STD-883 - TEST METHOD STANDARD MICROCIRCUITS
Published by NPFC on September 16, 2019
Purpose. This standard establishes uniform methods, controls, and procedures for testing microelectronic devices suitable for use within Military and Aerospace electronic systems including basic...
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