DLA - SMD-5962-96669 REV B
MICROCIRCUIT, DIGITAL, RADIATION HARDENED CMOS, DUAL UP COUNTERS, MONOLITHIC SILICON
active, Most Current
| Organization: | DLA |
| Publication Date: | 9 May 2000 |
| Status: | active |
| Page Count: | 24 |
scope:
This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class V). A choice of case outlines and lead finishes are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of Radiation Hardness Assurance (RHA) levels are reflected in the PIN.
intended Use:
Microcircuits conforming to this drawing are intended for use for Government microcircuit applications (original equipment), design applications, and logistics purposes.
Microcircuits... View More
Document History
SMD-5962-96669 REV B
May 9, 2000
MICROCIRCUIT, DIGITAL, RADIATION HARDENED CMOS, DUAL UP COUNTERS, MONOLITHIC SILICON
Microcircuits conforming to this drawing are intended for use for Government microcircuit applications (original equipment), design applications, and logistics purposes.
Microcircuits covered by...
January 22, 1998
MICROCIRCUIT, DIGITAL, RADIATION HARDENED CMOS, DUAL UP COUNTERS, MONOLITHIC SILICON
Microcircuit die conforming to this drawing are intended for use in microcircuits built in accordance with MIL-PRF-38535 or MIL-PRF-38534 for government microcircuit applications (original...
December 27, 1995
MICROCIRCUIT, DIGITAL, RADIATION HARDENED CMOS, DUAL UP COUNTERS, MONOLITHIC SILICON
A description is not available for this item.